Super-resolution imaging for sub-IR frequencies based on total internal reflection Article Swipe
Lauren E. Barr
,
Peter Karlsen
,
Samuel M. Hornett
,
Ian R. Hooper
,
Michal Mrnka
,
Christopher R. Lawrence
,
David B. Phillips
,
E. Hendry
·
YOU?
·
· 2020
· Open Access
·
· DOI: https://doi.org/10.1364/optica.408678
YOU?
·
· 2020
· Open Access
·
· DOI: https://doi.org/10.1364/optica.408678
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables subwavelength lateral resolution in images with contrast dependent on optical thickness. We illuminate a sample in a total internal reflection geometry, with a photoactivated spatial modulator in the near field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues.
Related Topics
Concepts
Optics
Image resolution
Resolution (logic)
Wavelength
Total internal reflection
Materials science
Angular resolution (graph drawing)
Reflection (computer programming)
Field of view
Sensitivity (control systems)
Spatial frequency
Contrast (vision)
Beam (structure)
Physics
Computer science
Mathematics
Combinatorics
Electronic engineering
Programming language
Engineering
Artificial intelligence
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1364/optica.408678
- OA Status
- gold
- Cited By
- 16
- References
- 44
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W3110838895
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W3110838895Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1364/optica.408678Digital Object Identifier
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Super-resolution imaging for sub-IR frequencies based on total internal reflectionWork title
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2020Year of publication
- Publication date
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2020-12-10Full publication date if available
- Authors
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Lauren E. Barr, Peter Karlsen, Samuel M. Hornett, Ian R. Hooper, Michal Mrnka, Christopher R. Lawrence, David B. Phillips, E. HendryList of authors in order
- Landing page
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https://doi.org/10.1364/optica.408678Publisher landing page
- Open access
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YesWhether a free full text is available
- OA status
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goldOpen access status per OpenAlex
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https://doi.org/10.1364/optica.408678Direct OA link when available
- Concepts
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Optics, Image resolution, Resolution (logic), Wavelength, Total internal reflection, Materials science, Angular resolution (graph drawing), Reflection (computer programming), Field of view, Sensitivity (control systems), Spatial frequency, Contrast (vision), Beam (structure), Physics, Computer science, Mathematics, Combinatorics, Electronic engineering, Programming language, Engineering, Artificial intelligenceTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
16Total citation count in OpenAlex
- Citations by year (recent)
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2025: 2, 2024: 2, 2023: 2, 2022: 5, 2021: 5Per-year citation counts (last 5 years)
- References (count)
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44Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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