Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors Article Swipe
Chao Wei
,
Timothy C. Petersen
,
Sorin Lazar
,
Joanne Etheridge
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.14293/apmc13-2025-0330
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.14293/apmc13-2025-0330
Related Topics
Concepts
Transmission electron microscopy
Scanning transmission electron microscopy
Symmetry (geometry)
Detector
Scanning confocal electron microscopy
Microscopy
Scanning electron microscope
Energy filtered transmission electron microscopy
Materials science
Transmission (telecommunications)
Conventional transmission electron microscope
Optics
Physics
Optoelectronics
Computer science
Mathematics
Geometry
Telecommunications
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.14293/apmc13-2025-0330
- OA Status
- gold
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4407192076
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4407192076Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.14293/apmc13-2025-0330Digital Object Identifier
- Title
-
Symmetry Scanning Transmission Electron Microscopy using Segmented DetectorsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2025Year of publication
- Publication date
-
2025-01-01Full publication date if available
- Authors
-
Chao Wei, Timothy C. Petersen, Sorin Lazar, Joanne EtheridgeList of authors in order
- Landing page
-
https://doi.org/10.14293/apmc13-2025-0330Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.14293/apmc13-2025-0330Direct OA link when available
- Concepts
-
Transmission electron microscopy, Scanning transmission electron microscopy, Symmetry (geometry), Detector, Scanning confocal electron microscopy, Microscopy, Scanning electron microscope, Energy filtered transmission electron microscopy, Materials science, Transmission (telecommunications), Conventional transmission electron microscope, Optics, Physics, Optoelectronics, Computer science, Mathematics, Geometry, TelecommunicationsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
0Total citation count in OpenAlex
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4407192076 |
|---|---|
| doi | https://doi.org/10.14293/apmc13-2025-0330 |
| ids.doi | https://doi.org/10.14293/apmc13-2025-0330 |
| ids.openalex | https://openalex.org/W4407192076 |
| fwci | 0.0 |
| type | article |
| title | Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors |
| biblio.issue | |
| biblio.volume | |
| biblio.last_page | |
| biblio.first_page | |
| topics[0].id | https://openalex.org/T12039 |
| topics[0].field.id | https://openalex.org/fields/25 |
| topics[0].field.display_name | Materials Science |
| topics[0].score | 0.9074000120162964 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2508 |
| topics[0].subfield.display_name | Surfaces, Coatings and Films |
| topics[0].display_name | Electron and X-Ray Spectroscopy Techniques |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C146088050 |
| concepts[0].level | 2 |
| concepts[0].score | 0.624358594417572 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q744818 |
| concepts[0].display_name | Transmission electron microscopy |
| concepts[1].id | https://openalex.org/C193016168 |
| concepts[1].level | 3 |
| concepts[1].score | 0.6189208030700684 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q874835 |
| concepts[1].display_name | Scanning transmission electron microscopy |
| concepts[2].id | https://openalex.org/C2779886137 |
| concepts[2].level | 2 |
| concepts[2].score | 0.5455214381217957 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q21030012 |
| concepts[2].display_name | Symmetry (geometry) |
| concepts[3].id | https://openalex.org/C94915269 |
| concepts[3].level | 2 |
| concepts[3].score | 0.5284115076065063 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q1834857 |
| concepts[3].display_name | Detector |
| concepts[4].id | https://openalex.org/C187921700 |
| concepts[4].level | 3 |
| concepts[4].score | 0.5256819725036621 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q7430074 |
| concepts[4].display_name | Scanning confocal electron microscopy |
| concepts[5].id | https://openalex.org/C147080431 |
| concepts[5].level | 2 |
| concepts[5].score | 0.5173041820526123 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q1074953 |
| concepts[5].display_name | Microscopy |
| concepts[6].id | https://openalex.org/C26771246 |
| concepts[6].level | 2 |
| concepts[6].score | 0.4816700220108032 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q321095 |
| concepts[6].display_name | Scanning electron microscope |
| concepts[7].id | https://openalex.org/C144783951 |
| concepts[7].level | 4 |
| concepts[7].score | 0.47544217109680176 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q907728 |
| concepts[7].display_name | Energy filtered transmission electron microscopy |
| concepts[8].id | https://openalex.org/C192562407 |
| concepts[8].level | 0 |
| concepts[8].score | 0.47184112668037415 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[8].display_name | Materials science |
| concepts[9].id | https://openalex.org/C761482 |
| concepts[9].level | 2 |
| concepts[9].score | 0.4296516180038452 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q118093 |
| concepts[9].display_name | Transmission (telecommunications) |
| concepts[10].id | https://openalex.org/C178423520 |
| concepts[10].level | 4 |
| concepts[10].score | 0.42628195881843567 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q744818 |
| concepts[10].display_name | Conventional transmission electron microscope |
| concepts[11].id | https://openalex.org/C120665830 |
| concepts[11].level | 1 |
| concepts[11].score | 0.40792521834373474 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q14620 |
| concepts[11].display_name | Optics |
| concepts[12].id | https://openalex.org/C121332964 |
| concepts[12].level | 0 |
| concepts[12].score | 0.38433611392974854 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[12].display_name | Physics |
| concepts[13].id | https://openalex.org/C49040817 |
| concepts[13].level | 1 |
| concepts[13].score | 0.37795764207839966 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[13].display_name | Optoelectronics |
| concepts[14].id | https://openalex.org/C41008148 |
| concepts[14].level | 0 |
| concepts[14].score | 0.34947705268859863 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[14].display_name | Computer science |
| concepts[15].id | https://openalex.org/C33923547 |
| concepts[15].level | 0 |
| concepts[15].score | 0.09678569436073303 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q395 |
| concepts[15].display_name | Mathematics |
| concepts[16].id | https://openalex.org/C2524010 |
| concepts[16].level | 1 |
| concepts[16].score | 0.08739158511161804 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q8087 |
| concepts[16].display_name | Geometry |
| concepts[17].id | https://openalex.org/C76155785 |
| concepts[17].level | 1 |
| concepts[17].score | 0.07060566544532776 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q418 |
| concepts[17].display_name | Telecommunications |
| keywords[0].id | https://openalex.org/keywords/transmission-electron-microscopy |
| keywords[0].score | 0.624358594417572 |
| keywords[0].display_name | Transmission electron microscopy |
| keywords[1].id | https://openalex.org/keywords/scanning-transmission-electron-microscopy |
| keywords[1].score | 0.6189208030700684 |
| keywords[1].display_name | Scanning transmission electron microscopy |
| keywords[2].id | https://openalex.org/keywords/symmetry |
| keywords[2].score | 0.5455214381217957 |
| keywords[2].display_name | Symmetry (geometry) |
| keywords[3].id | https://openalex.org/keywords/detector |
| keywords[3].score | 0.5284115076065063 |
| keywords[3].display_name | Detector |
| keywords[4].id | https://openalex.org/keywords/scanning-confocal-electron-microscopy |
| keywords[4].score | 0.5256819725036621 |
| keywords[4].display_name | Scanning confocal electron microscopy |
| keywords[5].id | https://openalex.org/keywords/microscopy |
| keywords[5].score | 0.5173041820526123 |
| keywords[5].display_name | Microscopy |
| keywords[6].id | https://openalex.org/keywords/scanning-electron-microscope |
| keywords[6].score | 0.4816700220108032 |
| keywords[6].display_name | Scanning electron microscope |
| keywords[7].id | https://openalex.org/keywords/energy-filtered-transmission-electron-microscopy |
| keywords[7].score | 0.47544217109680176 |
| keywords[7].display_name | Energy filtered transmission electron microscopy |
| keywords[8].id | https://openalex.org/keywords/materials-science |
| keywords[8].score | 0.47184112668037415 |
| keywords[8].display_name | Materials science |
| keywords[9].id | https://openalex.org/keywords/transmission |
| keywords[9].score | 0.4296516180038452 |
| keywords[9].display_name | Transmission (telecommunications) |
| keywords[10].id | https://openalex.org/keywords/conventional-transmission-electron-microscope |
| keywords[10].score | 0.42628195881843567 |
| keywords[10].display_name | Conventional transmission electron microscope |
| keywords[11].id | https://openalex.org/keywords/optics |
| keywords[11].score | 0.40792521834373474 |
| keywords[11].display_name | Optics |
| keywords[12].id | https://openalex.org/keywords/physics |
| keywords[12].score | 0.38433611392974854 |
| keywords[12].display_name | Physics |
| keywords[13].id | https://openalex.org/keywords/optoelectronics |
| keywords[13].score | 0.37795764207839966 |
| keywords[13].display_name | Optoelectronics |
| keywords[14].id | https://openalex.org/keywords/computer-science |
| keywords[14].score | 0.34947705268859863 |
| keywords[14].display_name | Computer science |
| keywords[15].id | https://openalex.org/keywords/mathematics |
| keywords[15].score | 0.09678569436073303 |
| keywords[15].display_name | Mathematics |
| keywords[16].id | https://openalex.org/keywords/geometry |
| keywords[16].score | 0.08739158511161804 |
| keywords[16].display_name | Geometry |
| keywords[17].id | https://openalex.org/keywords/telecommunications |
| keywords[17].score | 0.07060566544532776 |
| keywords[17].display_name | Telecommunications |
| language | en |
| locations[0].id | doi:10.14293/apmc13-2025-0330 |
| locations[0].is_oa | True |
| locations[0].source | |
| locations[0].license | cc-by |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | proceedings-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors |
| locations[0].landing_page_url | https://doi.org/10.14293/apmc13-2025-0330 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5023730987 |
| authorships[0].author.orcid | https://orcid.org/0000-0003-1581-8377 |
| authorships[0].author.display_name | Chao Wei |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Wei Chao |
| authorships[0].is_corresponding | False |
| authorships[1].author.id | https://openalex.org/A5071007453 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-8714-1484 |
| authorships[1].author.display_name | Timothy C. Petersen |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Timothy Petersen |
| authorships[1].is_corresponding | False |
| authorships[2].author.id | https://openalex.org/A5038215235 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-7257-6872 |
| authorships[2].author.display_name | Sorin Lazar |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Sorin Lazar |
| authorships[2].is_corresponding | False |
| authorships[3].author.id | https://openalex.org/A5010866490 |
| authorships[3].author.orcid | https://orcid.org/0000-0002-3199-3936 |
| authorships[3].author.display_name | Joanne Etheridge |
| authorships[3].author_position | last |
| authorships[3].raw_author_name | Joanne Etheridge |
| authorships[3].is_corresponding | False |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.14293/apmc13-2025-0330 |
| open_access.oa_status | gold |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T12039 |
| primary_topic.field.id | https://openalex.org/fields/25 |
| primary_topic.field.display_name | Materials Science |
| primary_topic.score | 0.9074000120162964 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2508 |
| primary_topic.subfield.display_name | Surfaces, Coatings and Films |
| primary_topic.display_name | Electron and X-Ray Spectroscopy Techniques |
| related_works | https://openalex.org/W4300747293, https://openalex.org/W4388100418, https://openalex.org/W1986420081, https://openalex.org/W2828275553, https://openalex.org/W2795314517, https://openalex.org/W4406539354, https://openalex.org/W2605268736, https://openalex.org/W2059936964, https://openalex.org/W3116153117, https://openalex.org/W2789123794 |
| cited_by_count | 0 |
| locations_count | 1 |
| best_oa_location.id | doi:10.14293/apmc13-2025-0330 |
| best_oa_location.is_oa | True |
| best_oa_location.source | |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | proceedings-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors |
| best_oa_location.landing_page_url | https://doi.org/10.14293/apmc13-2025-0330 |
| primary_location.id | doi:10.14293/apmc13-2025-0330 |
| primary_location.is_oa | True |
| primary_location.source | |
| primary_location.license | cc-by |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | proceedings-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Symmetry Scanning Transmission Electron Microscopy using Segmented Detectors |
| primary_location.landing_page_url | https://doi.org/10.14293/apmc13-2025-0330 |
| publication_date | 2025-01-01 |
| publication_year | 2025 |
| referenced_works_count | 0 |
| abstract_inverted_index | |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 4 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/7 |
| sustainable_development_goals[0].score | 0.7599999904632568 |
| sustainable_development_goals[0].display_name | Affordable and clean energy |
| citation_normalized_percentile.value | 0.03640121 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |