Defect segmentation is crucial for quality control in advanced manufacturing, yet data scarcity poses challenges for state-of-the-art supervised deep learning. Synthetic defect data generation is a popular approach for mitigating data challenges. However, many current methods simply generate defects following a fixed set of rules, which may not directly relate to downstream task performance. This can lead to suboptimal performance and may even hinder the downstream task. To solve this problem, we leverage a novel …