Système de gestion optimale du temps-mort intégré au gate-driver CMOS grâce à la mesure du courant de grille pour les MOSFETs SiC Article Swipe

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Matthieu Masson , Marc Cousineau , Nicolas Rouger , Frédéric Richardeau , Pierre Calmes , Matthew Bacchi ·

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Physics MOSFET CMOS Materials science Optoelectronics Transistor Voltage Quantum mechanics

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Type: article
Language: fr
Landing Page: https://hal.science/hal-04606906
OA Status: green
Related Works: 10
OpenAlex ID: https://openalex.org/W4399509950

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Title: Système de gestion optimale du temps-mort intégré au gate-driver CMOS grâce à la mesure du courant de grille pour les MOSFETs SiC

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Type: article

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Language: fr

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Publication year: 2024

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Publication date: 2024-06-06

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Authors: Matthieu Masson, Marc Cousineau, Nicolas Rouger, Frédéric Richardeau, Pierre Calmes, Matthew Bacchi

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Landing page: https://hal.science/hal-04606906

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OA status: green

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Concepts: Physics, MOSFET, CMOS, Materials science, Optoelectronics, Transistor, Voltage, Quantum mechanics

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