Test beam evaluation of newly developed n-in-p planar pixel sensors for use in a high radiation environment Article Swipe
Kento Kimura
,
Y. Yamaguchi
,
K. Motohashi
,
K. R. Nakamura
,
Y. Unno
,
O. Jinnouchi
,
S. Altenheiner
,
A. Blue
,
M. Bomben
,
Anja Butter
,
A. Cervelli
,
S. J. Crawley
,
A. Ducourthial
,
A. Gisen
,
M. Hagihara
,
K. Hanagaki
,
K. Hara
,
M. Hirose
,
Yuki Homma
,
Yoichi Ikegami
,
S. Kamada
,
T. Kono
,
A. Macchiolo
,
G. Marchiori
,
F. Meloni
,
M. Milovanović
,
A. Morton
,
G. Mullier
,
F.J. Muñoz
,
C. Nellist
,
B. Paschen
,
A. Quadt
,
T. Rashid
,
J. Rieger
,
A. Rummler
,
Kz. Sato
,
Kz. Sato
,
N. Savić
,
Hiromi Sawai
,
Kenneth G. Sexton
,
M. E. Stramaglia
,
M. Swiatlowski
,
R. Takashima
,
Y. Takubo
,
S. Terzo
,
K. Todome
,
J. Tojo
,
K. Van Houten
,
J. Weingarten
,
S. Wonsak
,
K. Wraight
,
K. Yamamura
·
YOU?
·
· 2016
· Open Access
·
· DOI: https://doi.org/10.1016/j.nima.2016.04.004
YOU?
·
· 2016
· Open Access
·
· DOI: https://doi.org/10.1016/j.nima.2016.04.004
Radiation-tolerant n-in-p planar pixel sensors have been under development in cooperation with Hamamatsu Photonics K.K. (HPK). This is geared towards applications in high-radiation environments, such as for the future Inner Tracker (ITk) placed in the innermost part of the ATLAS detector in the high luminosity LHC (HL-LHC) experiment. Prototypes of those sensors have been produced, irradiated, and evaluated over the last few years. In the previous studies, it was reported that significant drops in the detection efficiency were observed after irradiation, especially under bias structures. The bias structures are made up of poly-Si or Al bias rails and poly-Si bias resistors. The structure is implemented on the sensors to allow quality checks to be performed before the bump-bonding process, and to ensure that charge generated in floating pixels due to non-contacting or missing bump-bonds is dumped in a controlled way in order to avoid noise. To minimize the efficiency drop, several new pixel structures have been designed with bias rails and bias resistors relocated. Several test beams have been carried out to evaluate the drops in the detection efficiency of the new sensor structures after irradiation. Newly developed sensor modules were irradiated with proton-beams at the Cyclotron and Radio-Isotope Center (CYRIC) in Tohoku University to see the effect of sensor-bulk damage and surface charge-up. An irradiation with γ-rays was also carried out at Takasaki Advanced Radiation Research Center, with the goal of decoupling the effect of surface charge-up from that of bulk damage. Those irradiated sensors have been evaluated with particle beams at DESY and CERN. Comparison between different sensor structures confirmed significant improvements in minimizing efficiency loss under the bias structures after irradiation. The results from γ-irradiation also enabled cross-checking the results of a semiconductor technology simulation program (TCAD).
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Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1016/j.nima.2016.04.004
- OA Status
- gold
- Cited By
- 1
- References
- 17
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2314285068
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W2314285068Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1016/j.nima.2016.04.004Digital Object Identifier
- Title
-
Test beam evaluation of newly developed n-in-p planar pixel sensors for use in a high radiation environmentWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2016Year of publication
- Publication date
-
2016-04-09Full publication date if available
- Authors
-
Kento Kimura, Y. Yamaguchi, K. Motohashi, K. R. Nakamura, Y. Unno, O. Jinnouchi, S. Altenheiner, A. Blue, M. Bomben, Anja Butter, A. Cervelli, S. J. Crawley, A. Ducourthial, A. Gisen, M. Hagihara, K. Hanagaki, K. Hara, M. Hirose, Yuki Homma, Yoichi Ikegami, S. Kamada, T. Kono, A. Macchiolo, G. Marchiori, F. Meloni, M. Milovanović, A. Morton, G. Mullier, F.J. Muñoz, C. Nellist, B. Paschen, A. Quadt, T. Rashid, J. Rieger, A. Rummler, Kz. Sato, Kz. Sato, N. Savić, Hiromi Sawai, Kenneth G. Sexton, M. E. Stramaglia, M. Swiatlowski, R. Takashima, Y. Takubo, S. Terzo, K. Todome, J. Tojo, K. Van Houten, J. Weingarten, S. Wonsak, K. Wraight, K. YamamuraList of authors in order
- Landing page
-
https://doi.org/10.1016/j.nima.2016.04.004Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://resolver.sub.uni-goettingen.de/purl?gro-2/39456Direct OA link when available
- Concepts
-
Radiation hardening, Irradiation, Resistor, Pixel, Optoelectronics, Planar, Materials science, Optics, Detector, Large Hadron Collider, Radiation, Biasing, Radiation damage, Physics, Computer science, Electrical engineering, Engineering, Nuclear physics, Voltage, Computer graphics (images)Top concepts (fields/topics) attached by OpenAlex
- Cited by
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1Total citation count in OpenAlex
- Citations by year (recent)
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2016: 1Per-year citation counts (last 5 years)
- References (count)
-
17Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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