Testing the use of CXMS and DBS for weld inspection. Article Swipe
Mašláň, Miroslav
,
Pechoušek, Jiří
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.5281/zenodo.17541003
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.5281/zenodo.17541003
Mössbauer spectroscopy with scattered conversion X-ray registration (CXMS) and positron-electron annihilation (Doppler broadening spectroscopy) were tested with regard to their use in inspecting stainless steel welds. CXMS Mössbauer spectra were measured in scattering geometry with secondary X-ray radiation (energy 6.4 keV) recorded by a 2π gas flow detector. The spectra were recorded in 512 channels. The experimental data were processed using the MossWin 4.0 program. The energy scale was calibrated using pure alpha-iron. Doppler broadening spectroscopy measurements were performed using an HPGe semiconductor detector (Camberra), data accumulation was performed using a multichannel amplitude analyzer (LYNX) and GENIE software. The source of positrons was radioactive 22Na. As a result, no change was observed by Mössbauer spectroscopy, i.e., there were no changes in structural or phase composition. Positron annihilation (Doppler broadening spectroscopy) showed a reduction in defect concentration in areas close to the weld. The reduction in defect concentration is related to the heating of areas close to the weld.
Related Topics
Concepts
Doppler broadening
Materials science
Spectral line
Spectroscopy
Annihilation radiation
Welding
Radiation
Scattering
Doppler effect
Semiconductor detector
Annihilation
Detector
Positron annihilation spectroscopy
Phase (matter)
Positron annihilation
Optics
Positron
Nuclear physics
Spectrum analyzer
Amplitude
Particle detector
Measuring instrument
Energy (signal processing)
Analytical Chemistry (journal)
Instrumentation (computer programming)
Impurity
X-ray spectroscopy
Nuclear engineering
Nondestructive testing
Photon
Atomic physics
Semiconductor
Data reduction
Metadata
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- dataset
- Language
- en
- Landing Page
- https://doi.org/10.5281/zenodo.17541003
- OA Status
- green
- OpenAlex ID
- https://openalex.org/W7105741830
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W7105741830Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.5281/zenodo.17541003Digital Object Identifier
- Title
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Testing the use of CXMS and DBS for weld inspection.Work title
- Type
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datasetOpenAlex work type
- Language
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enPrimary language
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2025Year of publication
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2025-11-06Full publication date if available
- Authors
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Mašláň, Miroslav, Pechoušek, JiříList of authors in order
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https://doi.org/10.5281/zenodo.17541003Publisher landing page
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YesWhether a free full text is available
- OA status
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greenOpen access status per OpenAlex
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https://doi.org/10.5281/zenodo.17541003Direct OA link when available
- Concepts
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Doppler broadening, Materials science, Spectral line, Spectroscopy, Annihilation radiation, Welding, Radiation, Scattering, Doppler effect, Semiconductor detector, Annihilation, Detector, Positron annihilation spectroscopy, Phase (matter), Positron annihilation, Optics, Positron, Nuclear physics, Spectrum analyzer, Amplitude, Particle detector, Measuring instrument, Energy (signal processing), Analytical Chemistry (journal), Instrumentation (computer programming), Impurity, X-ray spectroscopy, Nuclear engineering, Nondestructive testing, Photon, Atomic physics, Semiconductor, Data reductionTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
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| abstract_inverted_index.(Doppler | 11, 127 |
| abstract_inverted_index.Positron | 125 |
| abstract_inverted_index.analyzer | 93 |
| abstract_inverted_index.detector | 83 |
| abstract_inverted_index.geometry | 33 |
| abstract_inverted_index.measured | 30 |
| abstract_inverted_index.observed | 111 |
| abstract_inverted_index.program. | 64 |
| abstract_inverted_index.recorded | 41, 51 |
| abstract_inverted_index.amplitude | 92 |
| abstract_inverted_index.channels. | 54 |
| abstract_inverted_index.detector. | 47 |
| abstract_inverted_index.performed | 78, 88 |
| abstract_inverted_index.positrons | 101 |
| abstract_inverted_index.processed | 59 |
| abstract_inverted_index.radiation | 37 |
| abstract_inverted_index.reduction | 132, 143 |
| abstract_inverted_index.scattered | 3 |
| abstract_inverted_index.secondary | 35 |
| abstract_inverted_index.software. | 97 |
| abstract_inverted_index.stainless | 23 |
| abstract_inverted_index.Mössbauer | 0, 27, 113 |
| abstract_inverted_index.broadening | 12, 74, 128 |
| abstract_inverted_index.calibrated | 69 |
| abstract_inverted_index.conversion | 4 |
| abstract_inverted_index.inspecting | 22 |
| abstract_inverted_index.scattering | 32 |
| abstract_inverted_index.structural | 121 |
| abstract_inverted_index.(Camberra), | 84 |
| abstract_inverted_index.alpha-iron. | 72 |
| abstract_inverted_index.radioactive | 103 |
| abstract_inverted_index.accumulation | 86 |
| abstract_inverted_index.annihilation | 10, 126 |
| abstract_inverted_index.composition. | 124 |
| abstract_inverted_index.experimental | 56 |
| abstract_inverted_index.measurements | 76 |
| abstract_inverted_index.multichannel | 91 |
| abstract_inverted_index.registration | 6 |
| abstract_inverted_index.spectroscopy | 1, 75 |
| abstract_inverted_index.concentration | 135, 146 |
| abstract_inverted_index.semiconductor | 82 |
| abstract_inverted_index.spectroscopy) | 13, 129 |
| abstract_inverted_index.spectroscopy, | 114 |
| abstract_inverted_index.positron-electron | 9 |
| cited_by_percentile_year | |
| countries_distinct_count | 1 |
| institutions_distinct_count | 2 |
| citation_normalized_percentile |