The Unique EELS Signature of Point Defects in Cubic Boron Nitride on Diamond Article Swipe
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· 2023
· Open Access
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· DOI: https://doi.org/10.1093/micmic/ozad067.930
· OA: W4385055369
Journal Article The Unique EELS Signature of Point Defects in Cubic Boron Nitride on Diamond Get access Andrew C Lang, Andrew C Lang Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Corresponding author: [email protected] Search for other works by this author on: Oxford Academic Google Scholar David F Storm, David F Storm Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Sergey I Maximenko, Sergey I Maximenko Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Neeraj Nepal, Neeraj Nepal Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Virginia D Wheeler, Virginia D Wheeler Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar David J Meyer David J Meyer Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington DC, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 1798, https://doi.org/10.1093/micmic/ozad067.930 Published: 22 July 2023
