Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed Tomography Article Swipe
Naru Okawa
,
Nozomu Ishiguro
,
Shuntaro Takazawa
,
Hideshi Uematsu
,
Yuhei Sasaki
,
Masaki Abe
,
Kyosuke Ozaki
,
Yoshiaki Honjo
,
H. Nishino
,
Yasumasa Joti
,
Takaki Hatsui
,
Yukio Takahashi
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1093/mam/ozae094
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1093/mam/ozae094
SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of −75° to +75° angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.
Related Topics
Concepts
Nanoscopic scale
Materials science
X-ray
Natural rubber
Sensitivity (control systems)
Resolution (logic)
Styrene-butadiene
Computed tomography
Tomography
Optics
Styrene
Composite material
Nanotechnology
Physics
Radiology
Medicine
Computer science
Engineering
Copolymer
Polymer
Electronic engineering
Artificial intelligence
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1093/mam/ozae094
- OA Status
- hybrid
- Cited By
- 3
- References
- 40
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4402635279
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4402635279Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1093/mam/ozae094Digital Object Identifier
- Title
-
Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and High-Sensitivity Ptychographic X-ray Computed TomographyWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2024Year of publication
- Publication date
-
2024-09-19Full publication date if available
- Authors
-
Naru Okawa, Nozomu Ishiguro, Shuntaro Takazawa, Hideshi Uematsu, Yuhei Sasaki, Masaki Abe, Kyosuke Ozaki, Yoshiaki Honjo, H. Nishino, Yasumasa Joti, Takaki Hatsui, Yukio TakahashiList of authors in order
- Landing page
-
https://doi.org/10.1093/mam/ozae094Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.1093/mam/ozae094Direct OA link when available
- Concepts
-
Nanoscopic scale, Materials science, X-ray, Natural rubber, Sensitivity (control systems), Resolution (logic), Styrene-butadiene, Computed tomography, Tomography, Optics, Styrene, Composite material, Nanotechnology, Physics, Radiology, Medicine, Computer science, Engineering, Copolymer, Polymer, Electronic engineering, Artificial intelligenceTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
3Total citation count in OpenAlex
- Citations by year (recent)
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2025: 2, 2024: 1Per-year citation counts (last 5 years)
- References (count)
-
40Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Microscopy and Microanalysis |
| primary_location.landing_page_url | https://doi.org/10.1093/mam/ozae094 |
| publication_date | 2024-09-19 |
| publication_year | 2024 |
| referenced_works | https://openalex.org/W2773810495, https://openalex.org/W2090508503, https://openalex.org/W2509811014, https://openalex.org/W2126888116, https://openalex.org/W2022462155, https://openalex.org/W2123258376, https://openalex.org/W2044933618, https://openalex.org/W1990919278, https://openalex.org/W4386387227, https://openalex.org/W1997926517, https://openalex.org/W2116749344, https://openalex.org/W6601468767, https://openalex.org/W2142894245, https://openalex.org/W2595276417, https://openalex.org/W2137089455, https://openalex.org/W4396709471, https://openalex.org/W1967663670, https://openalex.org/W2020860334, https://openalex.org/W4295021223, https://openalex.org/W2165161875, https://openalex.org/W2618647531, https://openalex.org/W2140952557, https://openalex.org/W2772629285, https://openalex.org/W2056103318, https://openalex.org/W2013225728, https://openalex.org/W2738752104, https://openalex.org/W2901890129, https://openalex.org/W2753098088, https://openalex.org/W2323719269, https://openalex.org/W4385477240, https://openalex.org/W2085160229, https://openalex.org/W2008134189, https://openalex.org/W1983481957, https://openalex.org/W2047563741, https://openalex.org/W2091742586, https://openalex.org/W2058716938, https://openalex.org/W2075314521, https://openalex.org/W2901522431, https://openalex.org/W2767168213, https://openalex.org/W36187607 |
| referenced_works_count | 40 |
| abstract_inverted_index.A | 76 |
| abstract_inverted_index.a | 36, 59, 100, 108 |
| abstract_inverted_index.76 | 63 |
| abstract_inverted_index.98 | 90 |
| abstract_inverted_index.an | 86 |
| abstract_inverted_index.by | 23 |
| abstract_inverted_index.in | 3, 39 |
| abstract_inverted_index.no | 66 |
| abstract_inverted_index.of | 42, 47, 52, 62, 79, 89, 93, 103, 112 |
| abstract_inverted_index.on | 99 |
| abstract_inverted_index.to | 44 |
| abstract_inverted_index.The | 15, 49 |
| abstract_inverted_index.and | 28, 65 |
| abstract_inverted_index.nm, | 64 |
| abstract_inverted_index.nm. | 91 |
| abstract_inverted_index.the | 29, 40, 53, 73, 80, 96, 104 |
| abstract_inverted_index.was | 83 |
| abstract_inverted_index.PXCT | 74 |
| abstract_inverted_index.SBR, | 97 |
| abstract_inverted_index.SiO2 | 1, 94, 114 |
| abstract_inverted_index.from | 95 |
| abstract_inverted_index.were | 7, 18, 33, 56, 70 |
| abstract_inverted_index.with | 20, 58, 85 |
| abstract_inverted_index.(SBR) | 6 |
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| abstract_inverted_index.X-ray | 11 |
| abstract_inverted_index.angle | 46 |
| abstract_inverted_index.based | 98 |
| abstract_inverted_index.image | 78 |
| abstract_inverted_index.phase | 105 |
| abstract_inverted_index.range | 41 |
| abstract_inverted_index.total | 24 |
| abstract_inverted_index.using | 9, 35 |
| abstract_inverted_index.CITIUS | 37 |
| abstract_inverted_index.X-rays | 21 |
| abstract_inverted_index.during | 72 |
| abstract_inverted_index.images | 51 |
| abstract_inverted_index.rubber | 5, 16, 54, 81 |
| abstract_inverted_index.shift, | 106 |
| abstract_inverted_index.(PXCT). | 14 |
| abstract_inverted_index.changes | 69 |
| abstract_inverted_index.focused | 22 |
| abstract_inverted_index.network | 110 |
| abstract_inverted_index.−75° | 43 |
| abstract_inverted_index.Abstract | 0 |
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| abstract_inverted_index.computed | 12 |
| abstract_inverted_index.detector | 38 |
| abstract_inverted_index.focusing | 26 |
| abstract_inverted_index.mirrors, | 27 |
| abstract_inverted_index.observed | 8, 71 |
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| abstract_inverted_index.significant | 67 |
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| abstract_inverted_index.measurements. | 75 |
| abstract_inverted_index.ptychographic | 10, 30 |
| abstract_inverted_index.reconstructed | 57, 84 |
| abstract_inverted_index.interconnected | 113 |
| abstract_inverted_index.two-dimensional | 60 |
| abstract_inverted_index.styrene-butadiene | 4 |
| abstract_inverted_index.three-dimensional | 77 |
| cited_by_percentile_year.max | 97 |
| cited_by_percentile_year.min | 90 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 12 |
| citation_normalized_percentile.value | 0.88696143 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | True |