Towards atom counting from first moment STEM images: methodology and possibilities Article Swipe
Yansong Hao
,
Annick De Backer
,
Scott D. Findlay
,
Sandra Van Aert
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2408.02405
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2408.02405
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to determine the unknown structure parameters of the images and to isolate contributions from individual atomic columns. In this way, a quantification of the projected potential per atomic column is achieved. Since the integrated projected potential of an atomic column scales linearly with the number of atoms it contains, it can serve as a basis for atom counting. The performance of atom counting from first moment STEM imaging is compared to that from traditional HAADF STEM in the presence of noise. Through this comparison, we demonstrate the advantage of first moment STEM images to attain more precise atom counts. Finally, we compare the integrated intensities extracted from first-moment images of a wedge-shaped sample to those values from the bulk crystal. The excellent agreement found between these values proves the robustness of using bulk crystal simulations as a reference library. This enables atom counting for samples with different shapes by comparison with these library values.
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Metadata
- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2408.02405
- https://arxiv.org/pdf/2408.02405
- OA Status
- green
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4403370415
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4403370415Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2408.02405Digital Object Identifier
- Title
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Towards atom counting from first moment STEM images: methodology and possibilitiesWork title
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preprintOpenAlex work type
- Language
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enPrimary language
- Publication year
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2024Year of publication
- Publication date
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2024-08-05Full publication date if available
- Authors
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Yansong Hao, Annick De Backer, Scott D. Findlay, Sandra Van AertList of authors in order
- Landing page
-
https://arxiv.org/abs/2408.02405Publisher landing page
- PDF URL
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https://arxiv.org/pdf/2408.02405Direct link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
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greenOpen access status per OpenAlex
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https://arxiv.org/pdf/2408.02405Direct OA link when available
- Concepts
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Moment (physics), Atom (system on chip), Computer science, Theoretical physics, Computer graphics (images), Physics, Theoretical computer science, Classical mechanics, Embedded systemTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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