Understanding the direct detection of charged particles with SiPMs Article Swipe

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F. Carnesecchi , G. Vignola , N. Agrawal , A. Alici , P. Antonioli , S. Arcelli , F. Bellini , D. Cavazza , L. Cifarelli , M. Colocci , S. Durando , F. Ercolessi , A. Ficorella , C. Fraticelli , M. Garbini , M. Giacalone , A. Gola , D. Hatzifotiadou , N. Jacazio , A. Margotti , G. Malfattore , R. Nania , F. Noferini , G. Paternoster , O. Pinazza , R. Preghenella , R. Rath , R. Ricci , L. Rignanese , N. Rubini , Bianca Sabiu , E. Scapparone , G. Scioli , S. Strazzi , S. Tripathy , A. Zichichi ·

YOU? · · 2022 · Open Access · · DOI: https://doi.org/10.48550/arxiv.2210.13244

In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

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Silicon photomultiplier Cherenkov radiation Charged particle Layer (electronics) Physics Optoelectronics Optics Nanotechnology Materials science Detector Scintillator Quantum mechanics Ion

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Type: preprint
Language: en
Landing Page: http://arxiv.org/abs/2210.13244
PDF: https://arxiv.org/pdf/2210.13244
OA Status: green
Related Works: 10
OpenAlex ID: https://openalex.org/W4307320280

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DOI: https://doi.org/10.48550/arxiv.2210.13244

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Title: Understanding the direct detection of charged particles with SiPMs

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Type: preprint

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Language: en

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Publication year: 2022

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Publication date: 2022-10-20

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Authors: F. Carnesecchi, G. Vignola, N. Agrawal, A. Alici, P. Antonioli, S. Arcelli, F. Bellini, D. Cavazza, L. Cifarelli, M. Colocci, S. Durando, F. Ercolessi, A. Ficorella, C. Fraticelli, M. Garbini, M. Giacalone, A. Gola, D. Hatzifotiadou, N. Jacazio, A. Margotti, G. Malfattore, R. Nania, F. Noferini, G. Paternoster, O. Pinazza, R. Preghenella, R. Rath, R. Ricci, L. Rignanese, N. Rubini, Bianca Sabiu, E. Scapparone, G. Scioli, S. Strazzi, S. Tripathy, A. Zichichi

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Landing page: https://arxiv.org/abs/2210.13244

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Concepts: Silicon photomultiplier, Cherenkov radiation, Charged particle, Layer (electronics), Physics, Optoelectronics, Optics, Nanotechnology, Materials science, Detector, Scintillator, Quantum mechanics, Ion

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