Using engineered defects to explore 3D feedback processes in current-driven metal. Article Swipe

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Edmund Yu , T. J. Awe , Kyle Cochrane , Maren Hatch , Kyle Peterson , T. M. Hutchinson , Kevin Yates , Kurt Tomlinson , William O. Tatum , B. S. Bauer , Brian Hutsel ·

YOU? · · 2021 · Open Access · · DOI: https://doi.org/10.2172/1883051

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Computer Science

Materials Science

Engineering

Electrical Engineering

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Current (fluid) Computer science Materials science Engineering Electrical engineering

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Type: article
Language: en
Landing Page: https://doi.org/10.2172/1883051
OA Status: green
Related Works: 10
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DOI: https://doi.org/10.2172/1883051

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Title: Using engineered defects to explore 3D feedback processes in current-driven metal.

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Type: article

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Language: en

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Publication year: 2021

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Publication date: 2021-08-01

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Authors: Edmund Yu, T. J. Awe, Kyle Cochrane, Maren Hatch, Kyle Peterson, T. M. Hutchinson, Kevin Yates, Kurt Tomlinson, William O. Tatum, B. S. Bauer, Brian Hutsel

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Landing page: https://doi.org/10.2172/1883051

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Open access: Yes

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OA status: green

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OA URL: https://www.osti.gov/biblio/1883051

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Concepts: Current (fluid), Computer science, Materials science, Engineering, Electrical engineering

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Cited by: 0

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Related works (count): 10

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