Variability sources and reliability of 3D — FeFETs Article Swipe
Milan Pešić
,
Bastien Beltrando
,
Andrea Padovani
,
Shruba Gangopadhyay
,
Kaliappan Muthukumar
,
Michael Haverty
,
Marco A. Villena
,
Enrico Piccinini
,
Matteo Bertocchi
,
Tony Chiang
,
Luca Larcher
,
Jack Strand
,
Alexander L. Shluger
·
YOU?
·
· 2021
· Open Access
·
· DOI: https://doi.org/10.1109/irps46558.2021.9405118
YOU?
·
· 2021
· Open Access
·
· DOI: https://doi.org/10.1109/irps46558.2021.9405118
Discovery of ferroelectricity (FE) in binary oxides enables the advent of FE memories and a plethora of novel CMOS compatible building blocks spanning from the logic domain to high-density storage and neuromorphic computing. In this paper we develop the first comprehensive model of vertical Ferroelectric Field Effect Transistor, V-FeFET, to identify sources of variability, understand retention problems, and point a path to improving reliability and enabling high-density storage FE memories with extended endurance.
Related Topics
Concepts
Neuromorphic engineering
Reliability (semiconductor)
Ferroelectricity
Transistor
Computer science
Domain (mathematical analysis)
Point (geometry)
Non-volatile memory
CMOS
Binary number
Logic gate
Materials science
Electronic engineering
Electrical engineering
Optoelectronics
Engineering
Physics
Artificial intelligence
Artificial neural network
Mathematics
Quantum mechanics
Dielectric
Geometry
Arithmetic
Voltage
Power (physics)
Mathematical analysis
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/irps46558.2021.9405118
- OA Status
- green
- Cited By
- 18
- References
- 54
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W3158867774
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W3158867774Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1109/irps46558.2021.9405118Digital Object Identifier
- Title
-
Variability sources and reliability of 3D — FeFETsWork title
- Type
-
articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2021Year of publication
- Publication date
-
2021-03-01Full publication date if available
- Authors
-
Milan Pešić, Bastien Beltrando, Andrea Padovani, Shruba Gangopadhyay, Kaliappan Muthukumar, Michael Haverty, Marco A. Villena, Enrico Piccinini, Matteo Bertocchi, Tony Chiang, Luca Larcher, Jack Strand, Alexander L. ShlugerList of authors in order
- Landing page
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https://doi.org/10.1109/irps46558.2021.9405118Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
-
https://hdl.handle.net/11380/1249315Direct OA link when available
- Concepts
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Neuromorphic engineering, Reliability (semiconductor), Ferroelectricity, Transistor, Computer science, Domain (mathematical analysis), Point (geometry), Non-volatile memory, CMOS, Binary number, Logic gate, Materials science, Electronic engineering, Electrical engineering, Optoelectronics, Engineering, Physics, Artificial intelligence, Artificial neural network, Mathematics, Quantum mechanics, Dielectric, Geometry, Arithmetic, Voltage, Power (physics), Mathematical analysisTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
18Total citation count in OpenAlex
- Citations by year (recent)
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2025: 3, 2024: 3, 2023: 7, 2022: 3, 2021: 2Per-year citation counts (last 5 years)
- References (count)
-
54Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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