Ari N. Blumer
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View article: Quantitative misfit dislocation characterization with electron channeling contrast imaging
Quantitative misfit dislocation characterization with electron channeling contrast imaging Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: EBSD of Rough Native CuInGaSe<sub>2</sub> Thin-Films
EBSD of Rough Native CuInGaSe<sub>2</sub> Thin-Films Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Reduced Dislocation Introduction in III–V/Si Heterostructures with Glide-Enhancing Compressively Strained Superlattices
Reduced Dislocation Introduction in III–V/Si Heterostructures with Glide-Enhancing Compressively Strained Superlattices Open
The novel use of a GaAsyP1-y/GaP compressively-strained superlattice (CSS) to provide enhanced control over misfit dislocation (MD) evolution and threading dislocation density (TDD) during GaP/Si metamorphic heteroepitaxy is demonstrated. …
View article: The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis
The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis Open
Journal Article The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis Get access BinBin Wang, BinBin Wang Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH USADept. of Materials Science…
View article: Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis Open
Journal Article Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis Get access Ari N Blumer, Ari N Blumer Dept. of Materials S…
View article: Monolayers: Concurrent Growth and Formation of Electrically Contacted Monolayer Transition Metal Dichalcogenides on Bulk Metallic Patterns (Adv. Mater. Interfaces 4/2017)
Monolayers: Concurrent Growth and Formation of Electrically Contacted Monolayer Transition Metal Dichalcogenides on Bulk Metallic Patterns (Adv. Mater. Interfaces 4/2017) Open
A chemical vapor deposition process resulting in self-contacted as-grown 2D materials-based devices is described by Eric Stinaff and co-workers. The center of the cover shows an as-grown MoS2 based photodiode device. Clockwise, the top fou…