C. H. Seager
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View article: Injection deep level transient spectroscopy: An improved method for measuring capture rates of hot carriers in semiconductors
Injection deep level transient spectroscopy: An improved method for measuring capture rates of hot carriers in semiconductors Open
In this study, an improved method for measuring the cross sections for carrier trapping at defects in semiconductors is described. This method, a variation of deep level transient spectroscopy(DLTS) used with bipolar transistors, is applie…
View article: Equilibrium state of hydrogen in gallium nitride: Theory and experiment
Equilibrium state of hydrogen in gallium nitride: Theory and experiment Open
Formation energies and vibration frequencies for H in wurtzite GaN were calculated from density-functional theory and used to predict equilibrium state occupancies and solid solubilities at elevated temperatures for p-type, intrinsic, and …
View article: Minority carrier diffusion, defects, and localization in InGaAsN, with 2% nitrogen
Minority carrier diffusion, defects, and localization in InGaAsN, with 2% nitrogen Open
Electron and hole transport in compensated InGaAsN (≈2% N) are examined through Hall mobility, photoconductivity, and solar cell photoresponse measurements. Short minority carrier diffusion lengths, photoconductive-response spectra, and do…
View article: Lattice location of deuterium in plasma and gas charged Mg doped GaN
Lattice location of deuterium in plasma and gas charged Mg doped GaN Open
The authors have used ion channeling to examine the lattice configuration of deuterium in Mg doped GaN grown by MOCVD. The deuterium is introduced both by exposure to deuterium gas and to ECR plasmas. A density functional approach includin…
View article: Infrared and transmission electron microscopy studies of ion-implanted H in GaN
Infrared and transmission electron microscopy studies of ion-implanted H in GaN Open
H and D have been implanted into undoped films of GaN heteroepitaxially grown on sapphire over a dose range from 5×1015 to 5×1017 ions/cm2. After a 600 °C post-implantation anneal, room temperature Fourier-transform-infrared spectroscopy r…
View article: Ion-implanted hydrogen in gallium nitride
Ion-implanted hydrogen in gallium nitride Open
Hydrogen was ion-implanted into GaN at concentrations ranging over two orders of magnitude, and its states and microstructural effects during annealing up to 1000 C were characterized by nuclear-reaction profiling, ion-channeling analysis,…
View article: Surface charging of phosphors and its effects on cathodoluminescence at low electron energies
Surface charging of phosphors and its effects on cathodoluminescence at low electron energies Open
Measurements of the threshold for secondary electron emission and shifts of the carbon Auger line position have been used to deduce the surface potential of several common phosphors during irradiation by electrons in the 0.5--5.0 keV range…
View article: Ultraviolet light induced annihilation of silicon dangling bonds in hydrogenated amorphous silicon nitride films
Ultraviolet light induced annihilation of silicon dangling bonds in hydrogenated amorphous silicon nitride films Open
We report results of electron paramagnetic resonance, photothermal deflection spectroscopy, and capacitance-voltage measurements on amorphous hydrogenated silicon nitride (a-SiNx:H) thin films exposed to ultraviolet (UV) illumination. It h…
View article: Chemical and electrical properties of cavities in silicon and germanium
Chemical and electrical properties of cavities in silicon and germanium Open
Cavities were formed in Si and Ge by He ion implantation and annealing, and resultant chemical and electrical properties were investigated. The dissociation energies for Si-H and Ge-H surface monohydride bonds were determined, showing that…
View article: Characterization of thermally stable dye-doped polyimide based electrooptic materials
Characterization of thermally stable dye-doped polyimide based electrooptic materials Open
Polymeric electrooptic materials have the potential to replace electronic switches in applications which require minimization of heat dissipation while maintaining high switching speeds. Polyimide matrices incorporating electrooptic dyes a…
View article: Mechanisms for the operation of thin film transistors on ferroelectrics
Mechanisms for the operation of thin film transistors on ferroelectrics Open
The electric field emanating from the surface of a poled ferroelectric can control the conduction properties of an overlaying semiconducting film, this combination of materials can thus serve as a non-destructive readout, non-volatile memo…
View article: The structural, chemical, and electrical properties of He-implantation-induced nanocavities in silicon
The structural, chemical, and electrical properties of He-implantation-induced nanocavities in silicon Open
Si implanted with He to doses of about 2 {times} 10{sup 16}cm{sup {minus}2} and greater and annealed at high temperatures develops a layer of internal nanocavities near the end of the He range. Above an annealing temperature of 700 C, all …
View article: Polyimide-based electrooptic materials
Polyimide-based electrooptic materials Open
The properties of new, high temperature optical materials based on dye-doped Ultradel{reg_sign} 9000D{sup 1} polyimides are presented. Ultradel 9000D is a soluble, pre-imidized, fluorinated polymer with properties optimized for integrated …
View article: Spin dependent photocurrents in ribbon solar cells
Spin dependent photocurrents in ribbon solar cells Open
Spin Dependent Transport (SDT) is a method of identifying recombination centers which employs a microwave resonance condition to affect the recombination rate of minority carriers in a device. When this technique is used to analyze the dif…
View article: EBIC (Electron Beam Induced Current) contrast of clean, decorated and deuterium passivated Si(Ge) epitaxial misfit dislocations
EBIC (Electron Beam Induced Current) contrast of clean, decorated and deuterium passivated Si(Ge) epitaxial misfit dislocations Open
The electrical activity of as-grown and intentionally decorated misfit dislocations in an epitaxial Si/Si(Ge) heterostructure was examined using the electron beam induced current (EBIC) technique in a scanning electron microscope. Misfit d…
View article: Minority Carrier Induced Debonding of Hydrogen From Shallow Donors in Silicon
Minority Carrier Induced Debonding of Hydrogen From Shallow Donors in Silicon Open
We have investigated the dissociation of donor-hydrogen pairs in Schottky barrier capacitors fabricated from phosphorus and arsenic doped silicon, at temperatures in the range 24 to 110{degree}C. In equilibrium the release of donor trapped…
View article: Direct measurement of majority-carrier quasi-Fermi levels in Schottky barrier and metal-insulator-semiconductor diodes
Direct measurement of majority-carrier quasi-Fermi levels in Schottky barrier and metal-insulator-semiconductor diodes Open
A novel point contact technique for directly measuring Fermi-level variations in biased semiconductor diodes is described. This technique is applied to Al/n-Si and Al/SiO2/p-Si structures, and the results are shown to be in good agreement …
View article: Equilibrium properties of thin-oxide metal-oxide-semiconductor diodes
Equilibrium properties of thin-oxide metal-oxide-semiconductor diodes Open
The zero-bias resistance and high frequency capacitance of Al- and Pd-gated thin-oxide metal-oxide-semiconductor diodes have been measured as a function of temperature. The temperature dependence of the semiconductor barrier height is foun…
View article: Fundamental studies of grain boundary passivation in polycrystalline silicon with application to improved photovoltaic devices. A research report covering work completed from February 1981 to January 1982
Fundamental studies of grain boundary passivation in polycrystalline silicon with application to improved photovoltaic devices. A research report covering work completed from February 1981 to January 1982 Open
Grain boundary barrier heights and other properties were measured on a variety of Wacker poly-Si to test the contention of Redfield that as received samples had no potential barriers and that temperature anneals activate the impurities in …
View article: Erratum: Grain boundary states and varistor behavior in silicon bicrystals
Erratum: Grain boundary states and varistor behavior in silicon bicrystals Open
First Page
View article: Fundamental studies of grain boundary passivation in polycrystalline silicon with application to improved photovoltaic devices. A final research report covering work completed from February-December 1979
Fundamental studies of grain boundary passivation in polycrystalline silicon with application to improved photovoltaic devices. A final research report covering work completed from February-December 1979 Open
Several aspects of the electrical properties of silicon grain boundaries have been studied. The temperature dependence of the zero-bias conductance and capacitance of single boundaries has been measured and shown to be in good agreement wi…
View article: Electronic properties of silicon grain boundaries
Electronic properties of silicon grain boundaries Open
Polycrystalline silicon is a clean and relatively simple prototype of electronic ceramics. The theory of the electrostatic barriers which form at silicon grain boundaries will be discussed. The use of experimental conductance and capacitan…
View article: High-Temperature Measurements of the Electron Hall Mobility in the Alkali Halides
High-Temperature Measurements of the Electron Hall Mobility in the Alkali Halides Open
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