C. Inguimbert
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View article: Multipacting mitigation by atomic layer deposition: The case study of titanium nitride
Multipacting mitigation by atomic layer deposition: The case study of titanium nitride Open
This study investigates the use of atomic layer deposition (ALD) to mitigate multipacting phenomena inside superconducting radio frequency cavities used in particle accelerators while preserving high quality factors in the 1010 range. The …
View article: Multipacting mitigation by atomic layer deposition: the case study of Titanium Nitride
Multipacting mitigation by atomic layer deposition: the case study of Titanium Nitride Open
This study investigates the use of Atomic Layer deposition (ALD) to mitigate multipacting phenomena inside superconducting radio frequency (SRF) cavities used in particle accelerators. The unique ALD capability to control the film thicknes…
View article: Damage Energy Threshold Anisotropy in Nonionizing Energy Loss Calculation
Damage Energy Threshold Anisotropy in Nonionizing Energy Loss Calculation Open
International audience
View article: Simulation multiéchelle pour la microélectronique sous radiation : du matériau au circuit
Simulation multiéchelle pour la microélectronique sous radiation : du matériau au circuit Open
National audience
View article: Radiation Tolerance of Low-Noise Photoreceivers for the LISA Space Mission
Radiation Tolerance of Low-Noise Photoreceivers for the LISA Space Mission Open
This study investigates the effects of space environmental radiation on the performance of InGaAs Quadrant Photodiodes (QPDs) and assesses their suitability for the Laser Interferometer Space Antenna (LISA) mission. QPDs of 1.0, 1.5 and 2.…
View article: Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences With Si
Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences With Si Open
International audience
View article: Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films
Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films Open
In this work, we have made experimental measurements of multiple-hump total electron emission yield (TEEY) curves on SiO2 thin films. A Monte-Carlo electron transport model, published in Gibaru et al., J. Electron Spectrosc. Relat. Phenom.…
View article: SEY Monte Carlo modelling of conditioned Ag and Cu substrates
SEY Monte Carlo modelling of conditioned Ag and Cu substrates Open
International audience
View article: Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films
Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films Open
View article: Use of combined linear and nonlinear formalisms applied to the transport of protons and secondary electrons in a Monte Carlo code: Applications for space missions
Use of combined linear and nonlinear formalisms applied to the transport of protons and secondary electrons in a Monte Carlo code: Applications for space missions Open
A review of linear (dielectric theory) and nonlinear (binary collision theory) formalisms is proposed. The range of validity of both theories is discussed. The differential energy cross sections are fully detailed so that they are suitable…
View article: Evaluation des sections efficaces d'endommagement des neutrons dans le GaN
Evaluation des sections efficaces d'endommagement des neutrons dans le GaN Open
International audience
View article: Modelling the impact on the secondary electron yield of carbon layers of various thicknesses on copper substrate
Modelling the impact on the secondary electron yield of carbon layers of various thicknesses on copper substrate Open
View article: Including a distribution of threshold displacement damage energy on the calculation of the damage function and electron's Non Ionizing energy Loss
Including a distribution of threshold displacement damage energy on the calculation of the damage function and electron's Non Ionizing energy Loss Open
View article: Surface ionizing dose deposited by low energy electrons (10 eV–10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions
Surface ionizing dose deposited by low energy electrons (10 eV–10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions Open
View article: Monte-Carlo simulation and analytical expressions for the extrapolated range and transmission rate of low energy electrons [10 eV–10 keV] in 11 monoatomic materials
Monte-Carlo simulation and analytical expressions for the extrapolated range and transmission rate of low energy electrons [10 eV–10 keV] in 11 monoatomic materials Open
View article: As-Grown InGaAsN Subcells for Multijunction Solar Cells by Molecular Beam Epitaxy
As-Grown InGaAsN Subcells for Multijunction Solar Cells by Molecular Beam Epitaxy Open
International audience
View article: Role of Electron-Induced Coulomb Interactions to the Total SEU Rate During Earth and JUICE Missions
Role of Electron-Induced Coulomb Interactions to the Total SEU Rate During Earth and JUICE Missions Open
International audience
View article: A Kinetic Monte Carlo Algorithm to Model the Annealing Process and Compute the Dark Current Nonuniformity
A Kinetic Monte Carlo Algorithm to Model the Annealing Process and Compute the Dark Current Nonuniformity Open
International audience
View article: Statistical spread on the displacement damage degradation of irradiated semiconductors
Statistical spread on the displacement damage degradation of irradiated semiconductors Open
View article: Extrapolated Range for Low Energy Electrons (< 1 keV)
Extrapolated Range for Low Energy Electrons (< 1 keV) Open
The Secondary Electron Emission (SEE) process plays an important role in the performance of various devices. Mitigating the multipactor phenomenon that may occur in radio-frequency components is a concern in many fields such as space techn…
View article: Monte Carlo Simulation of 3D Surface Morphologies for Secondary Electron Emission Reduction
Monte Carlo Simulation of 3D Surface Morphologies for Secondary Electron Emission Reduction Open
Low energy electrons of few tens of eV may cause Multipactor breakdowns in waveguides driven by the Secondary Electron Emission Yield (SEY) of the walls. This risk is lowered by using low emissive surfaces and this topic has been studied e…
View article: Surface Ionizing Dose for Space Applications Estimated With Low Energy Spectra Going Down to Hundreds of Electronvolt
Surface Ionizing Dose for Space Applications Estimated With Low Energy Spectra Going Down to Hundreds of Electronvolt Open
International audience
View article: Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2)
Geant4 physics processes for microdosimetry and secondary electron emission simulation: Extension of MicroElec to very low energies and 11 materials (C, Al, Si, Ti, Ni, Cu, Ge, Ag, W, Kapton and SiO2) Open
View article: Influence of a 3D electric field enhancement model on the Monte Carlo calculation of the dark current in pixel arrays
Influence of a 3D electric field enhancement model on the Monte Carlo calculation of the dark current in pixel arrays Open
A new three-dimensional (3D) electric field enhanced generation model has been developed to describe the electric field effects on the thermal electron–hole pair generation rate. The originality of this model lies in the full three-dimensi…
View article: Role of Electron-induced Coulomb Interactions to the Total SEU Rate during Earth and JUICE Missions
Role of Electron-induced Coulomb Interactions to the Total SEU Rate during Earth and JUICE Missions Open
International audience
View article: Surface ionizing dose for space applications estimated with low energy spectra going down to some hundreds of eV
Surface ionizing dose for space applications estimated with low energy spectra going down to some hundreds of eV Open
International audience
View article: Degradation study of InGaAsN PIN solar cell under 1 MeV electron irradiation
Degradation study of InGaAsN PIN solar cell under 1 MeV electron irradiation Open
International audience
View article: Awards Committee
Awards Committee Open
View article: A Kinetic Monte Carlo Algorithm to Model the Annealing Process to Compute the Dark Current Non Uniformity
A Kinetic Monte Carlo Algorithm to Model the Annealing Process to Compute the Dark Current Non Uniformity Open
International audience
View article: Development of 1 eV InGaAsN PIN subcell for MJSC integration and space application
Development of 1 eV InGaAsN PIN subcell for MJSC integration and space application Open
International audience