Chad Rue
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View article: Material Sputtering with a Multi‐Ion Species Plasma Focused Ion Beam
Material Sputtering with a Multi‐Ion Species Plasma Focused Ion Beam Open
Focused ion beams are an essential tool for cross‐sectional material analysis at the microscale, preparing TEM samples, and much more. New plasma ion sources allow for higher beam currents and options to use unconventional ion species, res…
View article: Focused Ion Beams of Xe<sup>+</sup>, Ar<sup>+</sup>, O<sup>+</sup>, and N<sup>+</sup>: Sputter Rate Trends, Chemical Interactions, and Emerging Applications
Focused Ion Beams of Xe<sup>+</sup>, Ar<sup>+</sup>, O<sup>+</sup>, and N<sup>+</sup>: Sputter Rate Trends, Chemical Interactions, and Emerging Applications Open
Journal Article Focused Ion Beams of Xe+, Ar+, O+, and N+: Sputter Rate Trends, Chemical Interactions, and Emerging Applications Get access Chad Rue, Chad Rue ThermoFisher Scientific, Advanced Technology Division, Hillsboro, OR, USA Corres…
View article: Plasma FIB Spin Milling for 3D Residual Stress Measurements
Plasma FIB Spin Milling for 3D Residual Stress Measurements Open
Journal Article Plasma FIB Spin Milling for 3D Residual Stress Measurements Get access B Winiarski, B Winiarski Thermo Fisher Scientific, V.Pecha 12, Brno 627 00, Czech RepublicThe Henry Royce Institute, School of Materials, The University…