Conal E. Murray
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View article: Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits
Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits Open
Non-equilibrium quasiparticles are possible sources for decoherence in superconducting qubits because they can lead to energy decay or dephasing upon tunneling across Josephson junctions (JJs). Here, we investigate the impact of the intrin…
View article: Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits
Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits Open
Quantum computing relies on the operation of qubits in an environment as free of noise as possible. Assessing the quality of this environment is a key aspect of ensuring high-fidelity implementations based on superconducting qubits. Relaxa…
View article: Quasiparticle tunneling as a probe of Josephson junction quality and capacitormaterial in superconducting qubits
Quasiparticle tunneling as a probe of Josephson junction quality and capacitormaterial in superconducting qubits Open
Non-equilibrium quasiparticles are possible sources for decoherence in superconducting qubits because they can lead to energy decay or dephasing upon tunneling across Josephson junctions (JJs). Here, we investigate the impact of the intrin…
View article: Review Article: Stress in thin films and coatings: Current status, challenges, and prospects
Review Article: Stress in thin films and coatings: Current status, challenges, and prospects Open
The issue of stress in thin films and functional coatings is a persistent problem in materials science and technology that has congregated many efforts, both from experimental and fundamental points of view, to get a better understanding o…
View article: Tailoring capping layers to reduce stress gradients in copper metallization
Tailoring capping layers to reduce stress gradients in copper metallization Open
Capping layers for back-end-of-line metallization, which primarily serve as diffusion barriers to prevent contamination, also play a role in mitigating electromigration in the underlying conductive material. Stress gradients can be generat…
View article: Nanoscale Strain Mapping in Embedded SiGe Devices by Dual Lens Dark Field Electron Holography and Precession Electron Diffraction
Nanoscale Strain Mapping in Embedded SiGe Devices by Dual Lens Dark Field Electron Holography and Precession Electron Diffraction Open
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View article: Efficient modeling of Bragg coherent x-ray nanobeam diffraction
Efficient modeling of Bragg coherent x-ray nanobeam diffraction Open
X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. H…
View article: PDJ volume 30 issue 2 Cover and Front matter
PDJ volume 30 issue 2 Cover and Front matter Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Linking strain anisotropy and plasticity in copper metallization
Linking strain anisotropy and plasticity in copper metallization Open
The elastic anisotropy of copper leads to significant variation in the x-ray elastic constants (XEC), which link diffraction-based strain measurements to stress. An accurate depiction of the mechanical response in copper thin films require…