D.W. Berning
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High speed IGBT module transient thermal response measurements for model validation Open
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Thermal component models for electro thermal analysis of multichip power modules Open
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An automated reverse-bias second-breakdown transistor tester Open
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IGBT model validation for soft-switching applications Open
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An automated reverse-bias second-breakdown transistor tester Open
An automated instrument is described for generating curves for the reverse-bias, safe-operating area of transistors nondestructively. A new technique for detecting second breakdown that makes automation possible is highlighted. Methods to …
A programmable reverse-bias safe operating area transistor testor Open
The circuits and construction of a transistor turn-off breakdown tester are described.Prin- ciples of operation for various circuits in the tester are discussed, as well as those for the complete system.Construction notes are given with la…
Power MOSFET temperature measurements Open
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Use of vacuum tubes in test instrumentation for measuring characteristics of fast high-voltage semiconductor devices Open
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A laser scanner for semiconductor devices Open
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