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View article: Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation
Wit-HW: Bug Localization in Hardware Design Code via Witness Test Case Generation Open
Debugging hardware designs requires significant manual effort during hardware development. After engineers identify a bug-triggering test case in simulation-based hardware verification, they usually spend considerable time analyzing the ex…
View article: Calculated interdiffusivities resulting from different fitting functions applied to measured concentration profiles in Cu-rich fcc Cu-Ni-Sn alloys at 1073 K
Calculated interdiffusivities resulting from different fitting functions applied to measured concentration profiles in Cu-rich fcc Cu-Ni-Sn alloys at 1073 K Open
Employing six groups of bulk diffusion couples together with electron probe microanalysis technique, the compositiondependences of ternary interdiffusion coefficients in Cu-rich fcc Cu-Ni-Sn alloys at 1073 K were determined via the Whittle…