Frieder Koch
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View article: Current Status of Hard X-Ray Nano-Tomography on the Transmission Microscope at the ANATOMIX Beamline
Current Status of Hard X-Ray Nano-Tomography on the Transmission Microscope at the ANATOMIX Beamline Open
The transmission X-ray microscope (TXM) on the Anatomix beamline welcomed its first nano-tomography users in 2019. The instrument is based on diffractive optics and works in the range of energies from 7 keV to 21 keV. A spatial resolution …
View article: PN Junctions Interface Passivation in 22 nm FDSOI for Low-Loss Passives
PN Junctions Interface Passivation in 22 nm FDSOI for Low-Loss Passives Open
In this paper, GlobalFoundries' 22 nm fully depleted (FD) SOI process was run on standard and high-resistivity wafers with a designed PN junctions interface passivation solution to counter parasitic surface conduction (PSC) effects. Substr…
View article: Current Status of Hard X-Ray Nano-Tomography on the Transmission Microscope at the ANATOMIX Beamline
Current Status of Hard X-Ray Nano-Tomography on the Transmission Microscope at the ANATOMIX Beamline Open
The transmission X-ray microscope (TXM) on the Anatomix beamline welcomed its first nano-tomography users in 2019. The instrument is based on diffractive optics and works in the range of energies from 7 keV to 21 keV. A spatial resolution …
View article: High-Resistivity Substrates with PN Interface Passivation in 22 nm FD-SOI
High-Resistivity Substrates with PN Interface Passivation in 22 nm FD-SOI Open
In this paper, GlobalFoundries’ 22 nm FD-SOI process was run on standard and high-resistivity wafers evaluating a PN junction interface passivation solution to counter parasitic surface conduction (PSC) effects. Substrate quality was monit…
View article: Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples
Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples Open
Imaging large areas of a sample non-destructively and with high resolution is of great interest for both science and industry. For scanning coherent X-ray diffraction microscopy, i. e., ptychography, the achievable scan area at a given spa…
View article: Desorption of polycyclic aromatic hydrocarbons by cosmic rays
Desorption of polycyclic aromatic hydrocarbons by cosmic rays Open
Context. The rate of sputtering and release of condensed species is an important aspect of interstellar chemistry, as is photodesorption for the most volatile species, because in the absence of such mechanisms the whole gas phase would hav…
View article: Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view
Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view Open
Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limit…
View article: CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV — ERRATUM
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV — ERRATUM Open
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View article: Soft x-ray microscopy with 7 nm resolution
Soft x-ray microscopy with 7 nm resolution Open
The availability of intense soft x-ray beams with tunable energy and polarization has pushed the development of highly sensitive, element-specific, and noninvasive microscopy techniques to investigate condensed matter with high spatial and…
View article: CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV Open
A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compound refractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensor thickness for increased sensitivity at high…
View article: Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques Open
Modern subtractive and additive manufacturing techniques present new avenues for X-ray optics with complex shapes and patterns. Refractive phase plates acting as glasses for X-ray optics have been fabricated, and spherical aberration in re…
View article: Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates
Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates Open
Double-sided Fresnel zone plates are diffractive lenses used for high-resolution hard X-ray microscopy. The double-sided structures have significantly higher aspect ratios compared with single-sided components and hence enable more efficie…
View article: Full-field hard X-ray microscopy based on aberration-corrected Be CRLs
Full-field hard X-ray microscopy based on aberration-corrected Be CRLs Open
To date, compound refractive X-ray lenses made out of Beryllium (Be CRLs) have been seldom applied for full-field microscopy with high spatial resolution, which was probably due to residual aberrations of these optics. However, in combinat…
View article: Wavefront sensing at X-ray free-electron lasers
Wavefront sensing at X-ray free-electron lasers Open
Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique ch…
View article: Ptychographic characterisation of polymer compound refractive lenses manufactured by additive technology
Ptychographic characterisation of polymer compound refractive lenses manufactured by additive technology Open
The recent success in the development of high-precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 nm reso…
View article: Towards X-ray transient grating spectroscopy
Towards X-ray transient grating spectroscopy Open
The extension of transient grating spectroscopy to the x-ray regime will create numerous opportunities, ranging from the study of thermal transport in the ballistic regime to charge, spin, and energy transfer processes with atomic spatial …
View article: Inspecting adaptive optics with at-wavelength wavefront metrology
Inspecting adaptive optics with at-wavelength wavefront metrology Open
Preserving the coherence and wavefront of a diffraction limited x-ray beam from the source to the experiment poses stringent quality requirements on the production processes for X-ray optics. In the near future this will require on-line an…
View article: Toward Hard X-ray Transmission Microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL
Toward Hard X-ray Transmission Microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: 7 nm Spatial Resolution in Soft X-ray Microscopy
7 nm Spatial Resolution in Soft X-ray Microscopy Open
Journal Article 7 nm Spatial Resolution in Soft X-ray Microscopy Get access Benedikt Rösner, Benedikt Rösner Paul Scherrer Institut, 5232 Villigen PSI, Switzerland Benedikt Rösner, [email protected] Search for other works by this aut…
View article: Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers
Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Scanning Hard X-Ray Microscopy Based on Be CRLs
Scanning Hard X-Ray Microscopy Based on Be CRLs Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis
At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis Open
The current advances in new generation X-ray sources are calling for the development and improvement of high-performance optics. Techniques for high-sensitivity phase sensing and wavefront characterisation, preferably performed at-waveleng…
View article: Comparison of laboratory grating-based and speckle-tracking x-ray phase-contrast imaging
Comparison of laboratory grating-based and speckle-tracking x-ray phase-contrast imaging Open
Phase-contrast imaging with x-rays is a developing field for imaging weakly absorbing materials. In this work, two phase-contrast imaging methods, grating- and speckle-based imaging, that measure the derivative of the phase shift, have bee…
View article: X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis
X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis Open
We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-induced modulation and subsequent computational demodulation of a random or periodic reference interference pattern. The proposed unified m…