G. Malfattore
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View article: Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs
Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs Open
In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been perf…
View article: Understanding the direct detection of charged particles with SiPMs
Understanding the direct detection of charged particles with SiPMs Open
In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with di…
View article: Direct detection of charged particles with SiPMs
Direct detection of charged particles with SiPMs Open
The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A c…