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View article: <i>Ab initio</i> study of angle-resolved electron reflection spectroscopy of few-layer graphene
<i>Ab initio</i> study of angle-resolved electron reflection spectroscopy of few-layer graphene Open
We present ab initio theory for electron reflection spectroscopy of few-layer graphene for arbitrary angles of incidence. The inelastic effects are included in a consistent way using the optical potential retrieved from ab initio simulatio…
View article: Deep Learning-Powered Optical Microscopy for Steel Research
Deep Learning-Powered Optical Microscopy for Steel Research Open
The success of machine learning (ML) models in object or pattern recognition naturally leads to ML being employed in the classification of the microstructure of steel surfaces. Light optical microscopy (LOM) is the traditional imaging proc…
View article: Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Open
Journal Article Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Get access Ilona Müllerová, Ilona Müllerová Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Repu…
View article: Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors Open
The segmented semiconductor detectors for transmitted electrons in ultrahigh resolution scanning electron microscopes allow observing samples in various imaging modes. Typically, two standard modes of objective lens, with and without a mag…
View article: Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer Open
The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics.…
View article: Methods of the electron induced cleanning in SEM
Methods of the electron induced cleanning in SEM Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Very Low Energy Electron Transmission Spectroscopy of 2D Materials
Very Low Energy Electron Transmission Spectroscopy of 2D Materials Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the 'Save PDF' action button.
View article: Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging
Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging Open
Carbon and carbon/metal systems with a multitude of functionalities are ubiquitous in new technologies but understanding on the nanoscale remains elusive due to their affinity for interaction with their environment and limitations in avail…
View article: In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM Open
Scanning electron microscopes come equipped with different types of detectors for the collection of signal electrons emitted from samples. In-lens detection systems mostly consist of several auxiliary electrodes that help electrons to trav…
View article: Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope
Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations
Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations Open
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
View article: Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
Practical Use of Scanning Low Energy Electron Microscope (SLEEM) Open
Journal Article Practical Use of Scanning Low Energy Electron Microscope (SLEEM) Get access Ilona Müllerová, Ilona Müllerová Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search f…