J. H. Stathis
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View article: Fundamental roles of extreme-value distributions in dielectric breakdown and memory applications (minimum-value versus maximum-value statistics)
Fundamental roles of extreme-value distributions in dielectric breakdown and memory applications (minimum-value versus maximum-value statistics) Open
In this paper, a thorough review of minimum- and maximum-value statistical distributions is provided. Using the Weibull model (statistics of minima) and the Gumbel model (statistics of maxima) along with the respective scaling properties o…
View article: Special Issue on Reliability
Special Issue on Reliability Open
Reliability is an important consideration during semiconductor technology development, which ensures that the performances of devices, circuits, and systems are maintained over a specified period of time, leading to successful products. De…