Jan Tröger
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View article: Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures
Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures Open
The continuous technological development of electronic devices and the introduction of new materials lead to ever greater demands on the fabrication of semiconductor heterostructures and their characterization. This work focuses on optimiz…
View article: Atomistic Compositional Details and Their Importance for Spin Qubits in Isotope‐Purified Silicon Quantum Wells
Atomistic Compositional Details and Their Importance for Spin Qubits in Isotope‐Purified Silicon Quantum Wells Open
Understanding crystal characteristics down to the atomistic level increasingly emerges as a crucial insight for creating solid state platforms for qubits with reproducible and homogeneous properties. Here, isotope concentration depth profi…
View article: Optimizing ToF-SIMS Depth Profiles of Semiconductor Heterostructures
Optimizing ToF-SIMS Depth Profiles of Semiconductor Heterostructures Open
The continuous technological development of electronic devices and the introduction of new materials leads to ever greater demands on the fabrication of semiconductor heterostructures and their characterization. This work focuses on optimi…
View article: Atomistic compositional details and their importance for spin qubits in isotope-purified silicon-germanium quantum wells
Atomistic compositional details and their importance for spin qubits in isotope-purified silicon-germanium quantum wells Open
Understanding crystal characteristics down to the atomistic level increasingly emerges as a crucial insight for creating solid state platforms for qubits with reproducible and homogeneous properties. Here, isotope composition depth profile…