Jo Bithell
2020
Measuring the Thickness of 2D Materials Using EDS
2020 • Samuel D. Marks, P. Pinard, Simon Burgess, Jo Bithell, Richard Beanland
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Exploring foci of
2020-07-30
Measuring the Thickness of 2D Materials Using EDS
2020-07-30 • Samuel D. Marks, P. Pinard, Simon Burgess, Jo Bithell, Richard Beanland
Journal Article Measuring the Thickness of 2D Materials Using EDS Get access Samuel Marks, Samuel Marks Oxford Instruments, High Wycombe, England, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Philippe Pinard, Philippe Pinard Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Simon Burgess, Simon Burgess Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom Search …
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His Dark Materials
Resilience (Materials Science)
Distance Measuring Equipment
Strength Of Materials
Bill Of Materials
Materials Science
Materials Recovery Facility
Slip (Materials Science)
Dæmon (His Dark Materials)
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