Jyun-Min Lin
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View article: Effects of Thermal Annealing on the Characteristics of High Frequency FBAR Devices
Effects of Thermal Annealing on the Characteristics of High Frequency FBAR Devices Open
In this study, piezoelectric zinc oxide (ZnO) thin film was deposited on the Pt/Ti/SiNx/Si substrate to construct the FBAR device. The Pt/Ti multilayers were deposited on SiNx/Si as the bottom electrode and the Al thin film was deposited o…
View article: Electrochromic Properties of Lithium-Doped Tungsten Oxide Prepared by Electron Beam Evaporation
Electrochromic Properties of Lithium-Doped Tungsten Oxide Prepared by Electron Beam Evaporation Open
In this study, xLi2O-(1−x)WO3 powders were mixed with WO3 and Li2O and pressed into target pellets to fabricate electrochromic films on indium tin oxide (ITO) glasses prepared by electron beam evaporation under the parameters of room tempe…