Karsten Prietzel
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View article: Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films
Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films Open
The article demonstrates how quantitative compositional depth profiles of Cu(In,Ga)(S,Se)2layers can be utilized to determine their energy bandgap distribution.
View article: Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy – a comparative study
Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy – a comparative study Open
Modifications at the CIGSe/CdS interface due to KF-PDT are studied using synchrotron radiation.