Kongjing Li
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View article: AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer Open
This paper describes an augmented reality (AR)-aided smart sensing technique for in-line condition monitoring of insulated-gate bipolar transistor (IGBT) wafers. A series of signal processing algorithms are applied for enabling sensor inte…
View article: Infrared and visible images registration with adaptable local-global feature integration for rail inspection
Infrared and visible images registration with adaptable local-global feature integration for rail inspection Open
Active thermography provides infrared images that contain sub-surface defect
\ninformation, while visible images only reveal surface information. Mapping in-
\nfrared information to visible images o ers more comprehensive visualization for…
View article: Electromagnetic pulsed thermography for natural cracks inspection
Electromagnetic pulsed thermography for natural cracks inspection Open
Emerging integrated sensing and monitoring of material degradation and cracks are increasingly required for characterizing the structural integrity and safety of infrastructure. However, most conventional nondestructive evaluation (NDE) me…
View article: Eddy Current Pulsed Thermography with Different Excitation Configurations for Metallic Material and Defect Characterization
Eddy Current Pulsed Thermography with Different Excitation Configurations for Metallic Material and Defect Characterization Open
This paper reviews recent developments of eddy current pulsed thermography (ECPT) for material characterization and nondestructive evaluation (NDE). Due to the fact that line-coil-based ECPT, with the limitation of non-uniform heating and …