L. Maingault
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View article: Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification
Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification Open
International audience
View article: X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits
X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits Open
Ionizing radiations pose risks to Integrated Circuits (ICs) in space devices and nuclear reactors, but their effects are mitigated by specific designs and redundancy. Besides characterizing radiation faults, X-rays can be intentionally use…
View article: Ray-Spect: Local Parametric Degradation for Secure Designs
Ray-Spect: Local Parametric Degradation for Secure Designs Open
International audience
View article: Toward Better Fault Characterization Tests
Toward Better Fault Characterization Tests Open
View article: Fast Calibration of Fault Injection Equipment with Hyperparameter Optimization Techniques
Fast Calibration of Fault Injection Equipment with Hyperparameter Optimization Techniques Open
View article: An End-to-End Approach for Multi-Fault Attack Vulnerability Assessment
An End-to-End Approach for Multi-Fault Attack Vulnerability Assessment Open
International audience
View article: Deep Learning Side-Channel Analysis on Large-Scale Traces
Deep Learning Side-Channel Analysis on Large-Scale Traces Open
View article: Nanofocused X-Ray Beam to Reprogram Secure Circuits
Nanofocused X-Ray Beam to Reprogram Secure Circuits Open