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View article: Deploying Human Activity Recognition in Embedded RISC-V Processors
Deploying Human Activity Recognition in Embedded RISC-V Processors Open
Human Activity Recognition (HAR) is an important area of research due to its applications in health monitoring, elderly care, and personal fitness tracking. The challenge is deploying efficient and accurate HAR systems on resource-constrai…
View article: MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities
MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities Open
The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM avail…
View article: MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities
MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities Open
The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM avail…
View article: A Survey on Deep Learning Resilience Assessment Methodologies
A Survey on Deep Learning Resilience Assessment Methodologies Open
International audience
View article: Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip Open
The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors detrimental to critical applications and fail-safe systems. This work evaluates the reli…
View article: Effects of High-Energy Protons on a Self-Refresh DRAM
Effects of High-Energy Protons on a Self-Refresh DRAM Open
This work targets the study of the effects of high-energy protons on a commercial self-refresh DRAM. The memory devices under investigation were exposed to high-energy protons varying in a range from 70 MeV up to 230 MeV at the Proton Irra…
View article: Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices Open
Studying the radiation effects on electronic devices is essential for avionics and space systems. The shrinking technology nodes and increasing density of devices enhance the sensitivity of electronic systems to ionizing radiation. Due to …
View article: Étude des effets induits par la radiation spatial et atmosphérique sur des mémoires électroniques
Étude des effets induits par la radiation spatial et atmosphérique sur des mémoires électroniques Open
Radiation is defined as the emission or transmission of energy as waves or particles, which can be either ionizing or non-ionizing. The interaction between the radiation and the matter can generate different reactions, which may vary depen…
View article: Neutron-induced effects on a self-refresh DRAM
Neutron-induced effects on a self-refresh DRAM Open
View article: Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks Open
International audience
View article: On the evaluation of FPGA radiation benchmarks
On the evaluation of FPGA radiation benchmarks Open
View article: Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks Open
Convolutional Neural Networks (CNNs) are currently one of the most widely used predictive models in machine learning. Recent studies have demonstrated that hardware faults induced by radiation fields, including cosmic rays, may significant…
View article: Reliability analysis of a fault-tolerant RISC-V system-on-chip
Reliability analysis of a fault-tolerant RISC-V system-on-chip Open
View article: Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study
Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study Open
This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-li…
View article: Characterization of a RISC-V System-on-Chip under Neutron Radiation
Characterization of a RISC-V System-on-Chip under Neutron Radiation Open
International audience
View article: A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications Open
International audience
View article: Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Open
Approximate Computing (AxC) is a well-known paradigm able to reduce the computational and power overheads of a multitude of applications, at the cost of a decreased accuracy. Convolutional Neural Networks (CNNs) have proven to be particula…
View article: A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems
A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems Open
International audience
View article: Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM Open
In this study, static and dynamic test methods were\nused to define the response of a self-refresh DRAM under\nthermal neutron irradiation. The neutron-induced failures were\ninvestigated and characterized by event cross-sections, soft-err…
View article: Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory Open
Space applications frequently use flash memories for mass storage data. However, the technology applied in the memory array and peripheral circuity are not inherently radiation tolerant. This work introduces the results of radiation test c…
View article: Design and Implementation of a Flexible Interface for TID Detector
Design and Implementation of a Flexible Interface for TID Detector Open
This paper introduces a flexible sensor interface for a radiation Total Ionizing Dose (TID) monitor. The board is conceived to be flexible and could be used with several detectors, the results reported in this work are based on the radiati…
View article: A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites
A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites Open
International audience