M. Gall
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View article: Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments
Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments Open
On the example of a 28nm SRAM array, this work presents a novel reliability study which takes into account the effect of externally applied mechanical stress in circuit simulations. This method is able to predict the bit failures caused by…