Michael Maisl
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View article: Target Design in SEM-Based Nano-CT and Its Influence on X-ray Imaging
Target Design in SEM-Based Nano-CT and Its Influence on X-ray Imaging Open
Nano-computed tomography (nano-CT) based on scanning electron microscopy (SEM) is utilized for multimodal material characterization in one instrument. Since SEM-based CT uses geometrical magnification, X-ray targets can be adapted without …
View article: Three-dimensional imaging of microstructural evolution in SEM-based nano-CT
Three-dimensional imaging of microstructural evolution in SEM-based nano-CT Open
Scanning electron microscopy (SEM) is a powerful and versatile technique for materials characterization and present in many laboratories. The integration of an X-ray target holder and detector allows expanding the modalities of SEM by X-ra…
View article: Computed tomography as a tool for industrial measurement
Computed tomography as a tool for industrial measurement Open
We present a prototype of a micro focus CT system that was designed especially for applications in metrology. The system comprises a high precision sample manipulator, a high resolution flat panel detector, and a stable micro focus X-ray s…
View article: A ray-length-based ROI-correction for computed laminography
A ray-length-based ROI-correction for computed laminography Open
Computed tomography (CT) is a well-established and widely used non-destractive inspection method for the analysis of the interior structure of objects. Applying Standard reconstruction methods for circular or helical sampling to planar obj…
View article: Characterisation and Modelling of Moisture Gradients in Polyamide 6
Characterisation and Modelling of Moisture Gradients in Polyamide 6 Open
Polyamide 6 (PA6) is able to absorb water from the surrounding air and bond to it by forming hydrogen bonds between the carbonamide groups of its molecular chains. Diffusion processes cause locally different water concentrations in the (co…
View article: Correlative Tomography – Combining x-ray nanotomography and FIB/SEM serial sectioning to analyze Al-Si cast alloys
Correlative Tomography – Combining x-ray nanotomography and FIB/SEM serial sectioning to analyze Al-Si cast alloys Open
Aluminium alloys with silicon as their major alloying element are widely used in die or sand casting of machine or vehicle parts. The microstructure of hypereutectic Al-Si alloys (>12% Si) consist of primary silicon particles and the Al-Si…
View article: Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography
Spherically symmetric volume elements as basis functions for image reconstructions in computed laminography Open
BACKGROUND: Laminography is a tomographic technique that allows three-dimensional imaging of flat, elongated objects that stretch beyond the extent of a reconstruction volume. Laminography datasets can be reconstructed using iterative algo…