Michael Wollensack
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View article: VNA Tools—A Metrology Software Supporting the Digital Traceability Chain
VNA Tools—A Metrology Software Supporting the Digital Traceability Chain Open
This paper presents METAS VNA Tools Version 2.9.0, a metrology software suite designed to support the digital traceability chain in vector network analyzer measurements. Built on the METAS UncLib Version 2.9.0 uncertainty engine, the softw…
View article: <em>VNA Tools</em> - A Metrology Software Supporting the Digital Traceability Chain
<em>VNA Tools</em> - A Metrology Software Supporting the Digital Traceability Chain Open
METAS VNA Tools is a metrology-grade software suite developed to facilitate measurements using vector network analyzers. Its uncertainty analysis is founded on a comprehensive modeling of the entire measurement process and is implemented t…
View article: PDF/A-3 solution for digital calibration certificates
PDF/A-3 solution for digital calibration certificates Open
The digitalization of metrology poses a challenge to all members of the metrology community. We propose an approach for digital calibration certificates (DCCs) based on a PDF/A-3 solution that could be a stepping-stone towards the digitali…
View article: Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies
Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies Open
Measuring the material parameters with a vector network analyzer (VNA) usually requires time-domain gating and complicated free-space calibrations. At terahertz frequencies, classic calibrations become more problematic and uncertainty calc…
View article: VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating
VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating Open
A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on normalization to a "Thru" connection and analyzing error-terms and multiple-reflection p…
View article: Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies
Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies Open
Material parameter extraction algorithms are studied and simplified both for transmission-reflection and transmission-only methods. The simplified relations, which are closed-form in some cases, are analyzed to establish the uncertainty se…
View article: Material Parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis
Material Parameter Extraction in THz Domain, Simplifications and Sensitivity Analysis Open
Classic equations for material parameter extraction are reconsidered and slightly modified to achieve stable results at all frequencies. Meanwhile, closed-form solutions are developed to simplify the material parameter extraction process a…