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View article: Analysis and modeling methods for predicting functional robustness of integrated circuits during fast transient events
Analysis and modeling methods for predicting functional robustness of integrated circuits during fast transient events Open
La miniaturisation des circuits intégrés se poursuit de nos jours avec le développement de technologies toujours plus fines et denses. Elle permet une intégration des circuits toujours plus massive, avec des performances plus élevées et un…
View article: TLP-based Human Metal Model stress generator and analysis method of ESD generators
TLP-based Human Metal Model stress generator and analysis method of ESD generators Open
International audience
View article: Hierarchical modeling approach for system level ESD analysis: From hard to functional failure
Hierarchical modeling approach for system level ESD analysis: From hard to functional failure Open
International audience