Roger Goerl
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View article: PCoSA: A product error correction code for use in memory devices targeting space applications
PCoSA: A product error correction code for use in memory devices targeting space applications Open
The radiation sensitivity of integrated memory cells increases dramatically as the supply voltage decreases. Although there are some Error Correcting Code (ECC) studies to prevent faults on memories used in space applications, there is no …
View article: Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits Open
International standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards are separatel…
View article: Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy
Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy Open
Embedded soft-core processors are becoming the usual solution to deal with network and data communications inside FPGAs. However, when developing space-based applications, the designer must consider the effects of ionizing radiation such a…