S. Dadouch
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View article: Novel approach to use the Kelvin probe method <i>ex-situ</i> for measuring the electron emission yield of insulator materials subjected to electron irradiation
Novel approach to use the Kelvin probe method <i>ex-situ</i> for measuring the electron emission yield of insulator materials subjected to electron irradiation Open
Measuring the total electron emission yield of dielectric materials remains a challenging task. Indeed, the charge induced by irradiation and electron emission disturbs the measurement. It is therefore important to quantify this charge dur…
View article: Novel approach to use the Kelvin Probe method ex-situ for measuring the electron emission yield of insulator materials subjected to electron irradiation
Novel approach to use the Kelvin Probe method ex-situ for measuring the electron emission yield of insulator materials subjected to electron irradiation Open
Measuring the total electron emission yield of dielectric materials remains a challenging task. Indeed, the charge induced by irradiation and electron emission disturbs the measurement. It is therefore important to quantify this charge dur…
View article: Multipacting mitigation by atomic layer deposition: the case study of Titanium Nitride
Multipacting mitigation by atomic layer deposition: the case study of Titanium Nitride Open
This study investigates the use of Atomic Layer deposition (ALD) to mitigate multipacting phenomena inside superconducting radio frequency (SRF) cavities used in particle accelerators. The unique ALD capability to control the film thicknes…
View article: Multipactor predictions for ion cyclotron resonance heating antennas of the tokamak WEST <sup>*</sup>
Multipactor predictions for ion cyclotron resonance heating antennas of the tokamak WEST <sup>*</sup> Open
During the plasma experimental campaigns performed on the tokamak WEST, a performance-limiting observation has been made on the Ion Cyclotron Resonance Heating (ICRH) system composed of three identical antennas. When only one antenna is po…
View article: Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films
Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films Open
In this work, we have made experimental measurements of multiple-hump total electron emission yield (TEEY) curves on SiO2 thin films. A Monte-Carlo electron transport model, published in Gibaru et al., J. Electron Spectrosc. Relat. Phenom.…
View article: Experimental and numerical study of the effect of dc electric field on the multipactor discharge threshold of Parallel-Plate Waveguide
Experimental and numerical study of the effect of dc electric field on the multipactor discharge threshold of Parallel-Plate Waveguide Open
International audience
View article: Impact of storage conditions and aging effect on RF breakdown and electrical performance in Metallic Flight Hardware
Impact of storage conditions and aging effect on RF breakdown and electrical performance in Metallic Flight Hardware Open
International audience
View article: Charging effect, aging and storage conditions impact on SEY of Dielectric Materials for Flight Hardware
Charging effect, aging and storage conditions impact on SEY of Dielectric Materials for Flight Hardware Open
International audience
View article: Experimental study of the effect of the temperature on the electron emission yield of silver surface
Experimental study of the effect of the temperature on the electron emission yield of silver surface Open
International audience
View article: Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling
Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling Open
The secondary electron emission phenomenon often refers to the emission of electrons as a result of the interaction of impinging energetic electrons with the surface of a material. Although it is fairly well described for metals, with a ty…
View article: A simple method for energy calibration of keV incident electron beam using a contactless electrostatic voltmeter probe
A simple method for energy calibration of keV incident electron beam using a contactless electrostatic voltmeter probe Open
A simple method is proposed to calibrate the energy of an electron beam. An electrical floating metal foil is irradiated by the incident electrons. The electron energy is deduced from the magnitude of the surface potential developed on the…
View article: ONERA copper TEEY measurements with various surface state and incidence angle
ONERA copper TEEY measurements with various surface state and incidence angle Open
These files are Total Electron Emission Yield (TEEY) measurements of two copper samples with various surface treatments. Energies range from 10 eV to 1 keV and incidence angle from 0° to 60°. Measurements were performed at the ONERA (Toulo…
View article: ONERA copper TEEY measurements with various surface state and incidence angle
ONERA copper TEEY measurements with various surface state and incidence angle Open
These files are Total Electron Emission Yield (TEEY) measurements of two copper samples with various surface treatments. Energies range from 10 eV to 1 keV and incidence angle from 0° to 60°. Measurements were performed at the ONERA (Toulo…
View article: Measurements of electron emission under electron impact on BN sample for incident electron energy between 10 eV and 1000 eV
Measurements of electron emission under electron impact on BN sample for incident electron energy between 10 eV and 1000 eV Open
International audience
View article: Spacecraft Worst Case Surface Charging: On the Importance of Measuring the Electron Emission Yield Under Representative Environmental Conditions
Spacecraft Worst Case Surface Charging: On the Importance of Measuring the Electron Emission Yield Under Representative Environmental Conditions Open
International audience
View article: Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses
Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses Open
International audience
View article: Evaluation of Electron-emitting Film for Spacecraft Charging Mitigation (ELFs Charm)
Evaluation of Electron-emitting Film for Spacecraft Charging Mitigation (ELFs Charm) Open
International audience
View article: Study of required conditions to limit the dielectric charging phenomenon when measuring the electron emission yield from thin dielectric layers
Study of required conditions to limit the dielectric charging phenomenon when measuring the electron emission yield from thin dielectric layers Open
International audience
View article: Dielectric charging mechanisms involved in the non-typical electron emission yield observed for thin dielectric layers
Dielectric charging mechanisms involved in the non-typical electron emission yield observed for thin dielectric layers Open
International audience
View article: On the secondary electron emission phenomenon when originating from very thin layers
On the secondary electron emission phenomenon when originating from very thin layers Open
International audience