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View article: What more can be done with XPS? Highly informative but underused approaches to XPS data collection and analysis
What more can be done with XPS? Highly informative but underused approaches to XPS data collection and analysis Open
Because of the importance of surfaces and interfaces in many scientific and technological areas, the use of x-ray photoelectron spectroscopy (XPS) has been growing exponentially. Although XPS is being used to obtain useful information abou…
View article: Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X‐Ray Photoelectron Spectroscopy and Low Energy Ion Scattering
Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in X‐Ray Photoelectron Spectroscopy and Low Energy Ion Scattering Open
X‐ray photoelectron spectroscopy (XPS) and low energy ion scattering (LEIS) are important methods for identifying and quantifying the elements at surfaces. XPS largely deals with zero‐loss peaks produced by unattenuated photoemission, and …
HAXPES: Inelastic background for characterization of nanostructured materials Open
Analysis of the spectrum of inelastically scattered electrons in XPS has been used for decades to determine the structure of materials on the nanoscale. Using the higher photon energies available in HAXPES, the method was recently shown to…
Determination of the Primary Excitation Spectra in XPS and AES Open
This paper reviews a procedure that allows for extracting primary photoelectron or Auger electron emissions from homogeneous isotropic samples. It is based on a quantitative dielectric description of the energy losses of swift electrons tr…
Comment on “Which fraction of stone wool fibre surface remains uncoated by binder? A detailed analysis by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy” by Hirth <i>et al.</i>, 2021, <i>RSC Adv.</i>, <b>11</b>, 39545, DOI: 10.1039/d1ra06251d Open
A thin organic layer (binder, oil, adventitious carbon) on a stone wool fibre surface is incomplete and inhomogeneous and leaves the bare fibre surface available for dissolution in lung fluid.
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XPS quantification with universal inelastic electron scattering cross section including intrinsic excitations Open
In X‐ray excited photoelectron emission (XPS), the shape and intensity of photoelectron peaks are strongly affected by extrinsic excitations due to electron transport out of the surface. It is also influenced by intrinsic excitations due t…
QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole Open
We present the user‐friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response d…
ELF dielectric functions for various materials. Open
Data for the energy loss function (ELF) of selected materials compiled from various publications. The imaginary part of the inverse of the dielectric function, Im{−1/ε(k,hω)}, denoted the energy loss function (ELF), is the leading function…
ELF dielectric functions for various materials. Open
Data for the energy loss function (ELF) of selected materials compiled from various publications. The imaginary part of the inverse of the dielectric function, Im{−1/ε(k,hω)}, denoted the energy loss function (ELF), is the leading function…
Using the inelastic background in hard x-ray photoelectron spectroscopy for a depth-resolved analysis of the CdS/Cu(In,Ga)Se2 interface Open
The inelastic background of hard x-ray photoelectron spectroscopy data is analyzed to paint a depth-resolved picture of the CdS/Cu(In,Ga)Se2 (CdS/CIGSe) layer structure. The CdS/CIGSe interface is the central component in next-generation c…
Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two‐ and three‐parameter cross‐sections Open
Determination of the depth distribution of complex nanostructures by X‐ray photoelectron spectroscopy (XPS) inelastic background analysis may be complicated if the sample materials have widely different inelastic scattering cross‐sections.…
Tutorial videos on the application of XPS inelastic background for characterization of composition and morphology of nano-structures with QUASES software Open
The tutorial videos illustrate the application of XPS inelastic background analysis for characterization of composition and morphology of nano-structures with QUASES software. For an introduction to the method, see: S. Tougaard "Practical …
View article: Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy Open
The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framewo…
Inelastic electron scattering by the gas phase in near ambient pressure XPS measurements Open
X‐ray photoemission spectroscopy (XPS) measurements in near‐ambient pressure (NAP) conditions result in a signal loss of the primary spectrum as a result of inelastic scattering of photoelectrons in the gas phase. The inelastic scattering …
Data for: Method to correct ambient pressure XPS for the distortion caused by the gas Open
Cross Section for N2 gas published as figure 2 in Sven Tougaard and Mark Greiner, "Method to correct ambient pressure XPS for the distortion caused by the gas" Applied Surface Science. (2020) First column: energy loss T in eV Second column…
Practical guide to the use of backgrounds in quantitative XPS Open
This guide is intended for both the novice in x-ray photoelectron spectroscopy (XPS) as well as users with some experience. XPS is one of the most widely used methods to characterize surface nanostructured samples, and XPS is now also comm…
Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements Open
Hard X-ray Photoelectron Spectroscopy (HAXPES) provides minimally destructive depth profiling into the bulk, extending the photoelectron sampling depth. Detection of deeply buried layers beyond the elastic limit is enabled through inelasti…
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Determining nonuniformities of core‐shell nanoparticle coatings by analysis of the inelastic background of X‐ray photoelectron spectroscopy survey spectra Open
Most real core‐shell nanoparticle (CSNP) samples deviate from an ideal core‐shell structure potentially having significant impact on the particle properties. An ideal structure displays a spherical core fully encapsulated by a shell of hom…
Optical properties of molybdenum in the ultraviolet and extreme ultraviolet by reflection electron energy loss spectroscopy Open
Optical properties of polycrystalline molybdenum are determined from ultraviolet up to extreme ultraviolet by reflection electron energy loss spectroscopy (REELS). Calculations are performed within the dielectric response theory by means o…
Effects of background gas composition and pressure on 1,4-polymyrcene (and polytetrafluoroethylene) spectra in near-ambient pressure XPS Open
Near-ambient pressure XPS (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at 2500 Pa or greater. With NAP-XPS, one can analyze moderately volatile liquids, biological sampl…
Correction to “Determining the Thickness and Completeness of the Shell of Polymer Core–Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy” Open
Figure 4 does not show the inelastic background analysis as it is described in the paper. Here we provide the correct Figure 4. (Figure Presented) .
Universal inelastic electron scattering cross‐section including extrinsic and intrinsic excitations in XPS Open
The high importance of X‐ray photoelectron spectroscopy (XPS) in surface analysis is well established. In XPS, the shape of the measured peaks is affected by two classes of energy loss: extrinsic losses because of the transport of photoele…
View article: Proliferation of Faulty Materials Data Analysis in the Literature
Proliferation of Faulty Materials Data Analysis in the Literature Open
As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem …
Determining the Thickness and Completeness of the Shell of Polymer Core–Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy Open
Core-shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core-shell structure. To control how the particles perform with regard to …
Theoretical study toward rationalizing inelastic background analysis of buried layers in <span>XPS</span> and <span>HAXPES</span> Open
The approach of inelastic background analysis was previously demonstrated to be a useful tool for retrieving the depth distribution of buried layers with an accuracy, which is better than 5% even for some complex samples. This paper presen…
Developments in Practical Applications of Inelastic Background Analysis to Characterize nano-structures Open
Recent advances in practical applications and software for non-destructive characterization of nano-structures by analysis of the inelastic background in photoelectron spectroscopy are discussed.
XPS primary excitation spectra of Zn 2 <i>p</i> , Fe 2 <i>p</i> , and Ce 3 <i>d</i> from ZnO, α‐Fe <sub>2</sub> O <sub>3</sub> , and CeO <sub>2</sub> Open
Metal oxides are important for current development in nanotechnology. X‐ray photoelectron spectroscopy(XPS) is a widely used technique to study the oxidation states of metals, and a basic understanding of the photoexcitation process is imp…
Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy Open
The recent advances in the inelastic background analysis of XPS spectra recorded with hard X-rays (HAXPES) make this method a powerful, non-destructive solution to retrieve the depth distribution of deeply buried elements. In this work, we…