Saqib Khursheed
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View article: Smart Power Dynamics in Pakistan's Counterterrorism Landscape
Smart Power Dynamics in Pakistan's Counterterrorism Landscape Open
Pakistan’s struggle with counterterrorism has been an extended and sophisticated battle, spanning decades of multifaceted, precise, and calculated tactical strategy, yielding both undeniable success and persistent challenges. This study ex…
View article: On-Chip Age Estimation Using Machine Learning
On-Chip Age Estimation Using Machine Learning Open
The semiconductor supply chain industry is spread worldwide to reduce costs and meet the high demand for integrated circuits (ICs) in electronic systems. The high utilisation of electronic devices in the next decade is forecasted to reach …
View article: Online Remaining Useful Lifetime Prediction Using Support Vector Regression
Online Remaining Useful Lifetime Prediction Using Support Vector Regression Open
An accurate prediction of remaining useful lifetime (RUL) in high reliability and safety electronic systems is required due to its wide use in industrial applications. In this paper, we propose a novel methodology for online RUL prediction…
View article: Hardware Trojan Detection on a PCB Through Differential Power Monitoring
Hardware Trojan Detection on a PCB Through Differential Power Monitoring Open
There is a general consensus that contemporary electronics are at risk of cyber-attacks or malicious modifications, such as Hardware Trojans (HT). This makes it crucial to develop reliable countermeasures at both Integrated Circuit (IC) an…
View article: Recycled IC detection through aging sensor
Recycled IC detection through aging sensor Open
In this paper, we propose a novel technique to detect recycled ICs via an on-chip, coarse-grained aging sensor, which can be applied to low-power circuits featuring power gating. The sensor detects the increase in the power-rail discharge …
View article: Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs Open
This document is the Accepted Manuscript version of the following article: Vasileios Tenentes, Daniele Rossi, Saqib Khursheed, Bashir M. Al-Hashimi, and Krishnendu Chakrabarty, ???Leakage Current Analysis for Diagnosis of Bridge Defects in…
View article: Dataset for: Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs
Dataset for: Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs Open
Dataset supports: Tenentes, V. et al (2017). Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
View article: Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure Open
In this paper, we present a novel coarse-grained technique for monitoring online the Bias Temperature Instability (BTI) aging of circuits by exploiting their power gating infrastructure. The proposed technique relies on monitoring the disc…
View article: Aging Benefits in Nanometer CMOS Designs
Aging Benefits in Nanometer CMOS Designs Open
In this brief, we show that bias temperature instability (BTI) aging of MOS transistors, together with its detrimental effect for circuit performance and lifetime, presents considerable benefits for static power consumption due to subthres…
View article: Reliable Power Gating With NBTI Aging Benefits
Reliable Power Gating With NBTI Aging Benefits Open
In this paper, we show that negative bias temperature instability (NBTI) aging of sleep transistors (STs), together with its detrimental effect for circuit performance and lifetime (LT), presents considerable benefits for power-gated circu…
View article: Data-set supporting the article entitled "Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure"
Data-set supporting the article entitled "Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure" Open
This dataset supports the article entitled "Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure", accepted for the publication in IEEE Transactions on Very Large Scale Integration Systems.
View article: BTI and leakage aware dynamic voltage scaling for reliable low power cache memories
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories Open
We propose a novel dynamic voltage scaling (DVS) approach for reliable and energy efficient cache memories. First, we demonstrate that, as memories age, leakage power reduction techniques become more effective due to sub-threshold current …
View article: NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating Open
In this paper we show that power gating techniques become more effective during their lifetime, since the aging of sleep transistors (STs) due to negative bias temperature instability (NBTI) drastically reduces leakage power. Based on this…
View article: Diagnosis of power switches with power-distribution-network consideration
Diagnosis of power switches with power-distribution-network consideration Open
This paper examines diagnosis of power switches when the power-distribution-network (PDN) is considered as a high resolution distributed electrical model. The analysis shows that for a diagnosis method to perform high diagnosis accuracy an…