Scott D. Findlay
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View article: Quantitative Structure Determination from Experimental Four-Dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix
Quantitative Structure Determination from Experimental Four-Dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix Open
Considerable inroads have recently been made on algorithms to determine the sample potential from four-dimensional scanning transmission electron microscopy data from thick samples where multiple scattering cannot be neglected. This paper …
View article: T1 precipitate stacks in an Al-Cu-Li-Mg-Ag alloy
T1 precipitate stacks in an Al-Cu-Li-Mg-Ag alloy Open
View article: Dopant site occupancy determined by core-loss-filtered, position-averaged convergent beam electron diffraction
Dopant site occupancy determined by core-loss-filtered, position-averaged convergent beam electron diffraction Open
In the elastic scattering regime, probe position-averaged convergent beam electron diffraction (PACBED) patterns have proven robust for estimating specimen thickness and mistilt. Through simulation, we show that core-loss-filtered PACBED p…
View article: Quantitative structure determination from experimental four-dimensional scanning transmission electron microscopy via the scattering matrix
Quantitative structure determination from experimental four-dimensional scanning transmission electron microscopy via the scattering matrix Open
Considerable inroads have recently been made on algorithms to determine the sample potential from four-dimensional scanning transmission electron microscopy data from thick samples where multiple scattering cannot be neglected. This paper …
View article: Real-space observation of polarization induced charges at nanoscale ferroelectric interfaces
Real-space observation of polarization induced charges at nanoscale ferroelectric interfaces Open
Unique electrical properties emerging at nanoscale ferroelectric interfaces originate from the polarization induced charges. However, real-space characterization of polarization induced charges at nanoscale ferroelectric interfaces has bee…
View article: Locating the Atoms at the Hard-soft Interface of Gold Nanoparticles
Locating the Atoms at the Hard-soft Interface of Gold Nanoparticles Open
Surface structure affects the growth, shape and properties of nanoparticles. In wet chemical syntheses, metal additives and surfactants are used to modify surfaces and guide nanocrystal growth. To understand this process, it is critical to…
View article: Phase Contrast via the Scattering Matrix Formulation of 4D Scanning Transmission Electron Microscopy
Phase Contrast via the Scattering Matrix Formulation of 4D Scanning Transmission Electron Microscopy Open
View article: Unsupervised Deep Denoising for Low-Dose 4D-STEM
Unsupervised Deep Denoising for Low-Dose 4D-STEM Open
View article: Counting Atoms in Gold Nanoparticles Using Low Dose Four-Dimensional Scanning Electron Microscopy with Supervised Machine Learning
Counting Atoms in Gold Nanoparticles Using Low Dose Four-Dimensional Scanning Electron Microscopy with Supervised Machine Learning Open
View article: Experimental Crystal Structure From 4D STEM via the Scattering Matrix
Experimental Crystal Structure From 4D STEM via the Scattering Matrix Open
View article: Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements Open
A detailed analysis of ptychography for three-dimensional (3D) phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstru…
View article: Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy
Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy Open
By simultaneously achieving high spatial and angular sampling resolution, four dimensional scanning transmission electron microscopy (4D STEM) is enabling analysis techniques that provide great insight into the atomic structure of material…
View article: Differential phase contrast from electrons that cause inner shell ionization
Differential phase contrast from electrons that cause inner shell ionization Open
View article: Towards atom counting from first moment STEM images: methodology and possibilities
Towards atom counting from first moment STEM images: methodology and possibilities Open
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares e…
View article: Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements Open
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the bea…
View article: Direct Imaging of Atomic Rattling Motion in a Clathrate Compound
Direct Imaging of Atomic Rattling Motion in a Clathrate Compound Open
Controlling nanoscale heat generation, dissipation, and transport is crucial for miniaturizing electronic devices and for designing highly efficient thermoelectric materials. However, it has been challenging to directly measure thermal pro…
View article: Atom-counting for heterogeneous nanostructures using multimodal STEM
Atom-counting for heterogeneous nanostructures using multimodal STEM Open
View article: Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron Microscopy
Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron Microscopy Open
One approach to three-dimensional structure determination using the wealth of scattering data in four-dimensional (4D) scanning transmission electron microscopy (STEM) is the parallax method proposed by Ophus et al. (2019. Advanced phase r…
View article: Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix
Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix Open
We present a gradient-descent-based approach to determining the projected electrostatic potential from four-dimensional scanning transmission electron microscopy measurements of a periodic, crystalline material even when dynamical scatteri…
View article: P281: Incorporating regulatory information improves interpretation of noncoding variants*
P281: Incorporating regulatory information improves interpretation of noncoding variants* Open
View article: The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography
The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography Open
Segmented and pixelated detectors on scanning transmission electron microscopes enable the complex specimen transmission function to be reconstructed. Imaging the transmission function is key to interpreting the electric and magnetic prope…
View article: A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation
A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation Open
Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal seri…
View article: Real-space visualization of intrinsic magnetic fields of an antiferromagnet
Real-space visualization of intrinsic magnetic fields of an antiferromagnet Open
Characterizing magnetic structures down to atomic dimensions is central to the design and control of nanoscale magnetism in materials and devices. However, real-space visualization of magnetic fields at such dimensions has been extremely c…
View article: Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector Open
View article: Direct imaging of metal additives on Au nanocube surface using 4D-STEM
Direct imaging of metal additives on Au nanocube surface using 4D-STEM Open
View article: Reaching for atomic-scale quantitative energy dispersive X-ray spectroscopy
Reaching for atomic-scale quantitative energy dispersive X-ray spectroscopy Open
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View article: Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value Open
Recent work has revived interest in the scattering matrix formulation of electron scattering in transmission electron microscopy as a stepping stone toward atomic-resolution structure determination in the presence of multiple scattering. W…
View article: Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix
Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix Open
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear i…
View article: Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale Open
View article: Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging Open