Tomáš Radlička
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View article: Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM
Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM Open
Phase contrast imaging is well-suited for studying weakly scattering samples. Its strength lies in its ability to measure how the phase of the electron beam is affected by the sample, even when other imaging techniques yield low contrast. …
View article: Advances in atomic resolution secondary electron imaging
Advances in atomic resolution secondary electron imaging Open
We have developed an efficient detector of secondary electrons (SEs) for a high-performance scanning transmission electron microscope (STEM) and tested it on several materials. Using the detector at 60 keV, we resolved the nearest neighbor…
View article: Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM
Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM Open
Journal Article Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM Get access M T Hotz, M T Hotz Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Search for other works by this author on: Oxford Academic Google Schola…
View article: Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer Open
The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics.…
View article: Very Low Energy Electron Transmission Spectroscopy of 2D Materials
Very Low Energy Electron Transmission Spectroscopy of 2D Materials Open
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View article: Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade
Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade Open
The signal generation mechanism of the scanning field-emission microscope has been investigated via model calculations combining deterministic trajectory calculations in the field surrounding the field-emission tip in vacuum, with Monte Ca…
View article: Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density
Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density Open
We present a numerical method for iterative computation of electron optical systems influenced by space charge with an improved accuracy in the same calculation time. We replace the common algorithm for evaluating the space charge distribu…
View article: Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope
Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope Open
A wave optical calculation of the probe size of a low energy scanning electron microscope is presented. The resolution for the optimal aperture was computed and compared with results of standard approaches. The effect of deflection aberrat…
View article: Simulation and Optimization of a Carbon Nanotube Electron Source
Simulation and Optimization of a Carbon Nanotube Electron Source Open
This paper deals with an optimization of a field-emission structure concept based on vertically aligned carbon nanotubes (CNT). A design concept for a fabrication method for a gate structure based on electron beam lithography is reviewed i…