U. Ramsperger
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View article: LEA—A NOVEL LOW ENERGY ACCELERATOR FOR <sup>14</sup>C DATING
LEA—A NOVEL LOW ENERGY ACCELERATOR FOR <sup>14</sup>C DATING Open
A newly developed compact AMS, LEA (Low Energy Accelerator), is tested and compared with a state-of-the-art AMS system MICADAS (Mini Carbon Dating System), which has a precision performance of better than 1‰ for modern 14 C. The main diffe…
View article: The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy
The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy Open
Electron spectroscopy proves to be a handy tool in material science. Combination of electron spectroscopy and scanning probe microscopy is possible through Scanning Field Emission Microscopy (SFEM), where a metallic probe positioned close …
View article: Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy
Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy Open
We simulate the electronic system of ejected electrons arising when a tip, positioned few 10 nm away from a surface, is operated in the field emission regime. We find that, by repeated quantum reflections (“quantum skipping”), electrons pr…
View article: Non-topographic current contrast in scanning field emission microscopy
Non-topographic current contrast in scanning field emission microscopy Open
In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R.…
View article: Vectorial, non-destructive magnetic imaging with scanning tunneling microscopy in the field emission regime
Vectorial, non-destructive magnetic imaging with scanning tunneling microscopy in the field emission regime Open
When a scanning tunneling microscope is operated at tip-target distances ranging from few nanometers to few tens of nanometers (Fowler-Nordheim or field emission regime), a new electronic system appears, consisting of electrons that escape…
View article: Multiparameter Analysis of Genesis and Evolution of Secondary Electrons produced in the Low Energy Regime
Multiparameter Analysis of Genesis and Evolution of Secondary Electrons produced in the Low Energy Regime Open
The objective of my PhD-research was focussed on the investigation of the fundamental mechanisms relevant to the generation-ejection mechanisms of secondary electrons from solids under electron bombardment in the Low-Energy regime. This wo…
View article: Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography
Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography Open
Off‐axis electron holography can be used to measure the electron‐optical phase shift associated with a charge density distribution in the transmission electron microscope (TEM). The charge density can then be recovered either by integratin…
View article: Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy
Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy Open
We perform scanning tunnelling microscopy (STM) in a regime where primary electrons are field-emitted from the tip and excite secondary electrons out of the target—the scanning field-emission microscopy regime (SFM). In the SFM mode, a sec…
View article: Critical exponents and scaling invariance in the absence of a critical point
Critical exponents and scaling invariance in the absence of a critical point Open
The paramagnetic-to-ferromagnetic phase transition is believed to proceed through a critical point, at which power laws and scaling invariance, associated with the existence of one diverging characteristic length scale -- the so called cor…