Uwe Arz
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View article: An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz
An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz Open
sponsorship: This work was supported in part by the EMPIR project under Grant 18SIB09 TEMMT, in part by the EPM project under Grant 23IND10 OnMicro, in part by the Dutch Ministry of Economic Affairs and Climate, in part by the Frech Renate…
View article: Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines (TFMSLs)
Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines (TFMSLs) Open
This paper analyzes the Signal Integrity (SI) performance of thin-film microstrip lines (TFMSL), in view of their use in future communication systems, operating at unprecedented high I/O data rates (over 30 Gb/s) and high frequency (over 6…
View article: Recommendations for the Design of Differential Thin-Film Microstrip Lines
Recommendations for the Design of Differential Thin-Film Microstrip Lines Open
Reliable high-speed data transmission and high-speed electronic components require a high level of Signal Integrity (SI) to handle hundreds of channels and thousands of input/output connections on a single chip. Due to the increasing deman…
View article: Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides Open
On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effe…
View article: Report describing the comparison of material parameter measurements at millimetre-wave and THz frequencies
Report describing the comparison of material parameter measurements at millimetre-wave and THz frequencies Open
This pilot study was part of the EMPIR (18SIB09) TEMMT project and was registered as the EURAMET 1514 comparison. Therein, different methods for material parameter measurements in the THz spectral range were compared. The different measure…
View article: High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness
High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness Open
An existing analytical transmission line model to describe propagation properties of coplanar waveguides including dispersion and radiation effects was extended to take into account surface roughness of conductor traces. The influence of p…
View article: A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies
A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies Open
In this paper, we present a comparative study of S-parameter measurements of electronic components on planar substrates performed with a waveguide module and in a conventional on-wafer probing environment. Measurements were conducted at th…
View article: Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz
Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz Open
In this paper, we present a comprehensive uncertainty budget for on-wafer S-parameter measurements of devices on a custom-built fused silica wafer, including instrumentation errors, connector repeatability, and calibration standard uncerta…