Weihe Xu
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View article: Machine learning-aided automatic recognition and precise localization of marker layers within multilayer Laue lenses (MLLs) for high-resolution X-ray nanofocusing
Machine learning-aided automatic recognition and precise localization of marker layers within multilayer Laue lenses (MLLs) for high-resolution X-ray nanofocusing Open
View article: A versatile high-speed x-ray microscope for sub-10 nm imaging
A versatile high-speed x-ray microscope for sub-10 nm imaging Open
We have developed a next-generation scanning x-ray microscope RASMI (RApid Scanning Microscopy Instrument) for high-throughput tomographic imaging. RASMI is installed at the hard x-ray nanoprobe beamline at NSLS-II and is capable of manipu…
View article: Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition
Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition Open
Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, …
View article: A machine-learning-based approach for angular alignment of 2D multilayer Laue lenses for high-resolution hard x-ray microscopy
A machine-learning-based approach for angular alignment of 2D multilayer Laue lenses for high-resolution hard x-ray microscopy Open
Multilayer Laue lenses (MLLs) are promising optics for high efficiency nano focusing in the hard x-ray regime. However, since MLLs are one-dimensional focusing elements, a pair of MLLs need to be orthogonally aligned with respect to each o…
View article: High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II
High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II Open
We are developing a next-generation scanning x-ray microscope that will significantly enhance 3D ptychographic imaging capabilities available at NSLS-II. One of the important technical tasks pertains to providing high-speed data acquisitio…
View article: Research trends of worldwide ophthalmologic randomized controlled trials in the 21st century: A bibliometric study
Research trends of worldwide ophthalmologic randomized controlled trials in the 21st century: A bibliometric study Open
Overall, the number of global ophthalmologic RCTs in the 21st century was keeping growing, there was an imbalance between the regions and institutions, and more efforts are required to raise the quantity, quality, and global impact of high…
View article: Achieving High-Resolution Hard X-ray Microscopy using Monolithic 2D Multilayer Laue Lenses
Achieving High-Resolution Hard X-ray Microscopy using Monolithic 2D Multilayer Laue Lenses Open
This article introduces the 2D multilayer Laue lens (MLL) nanofocusing optics recently developed for high-resolution hard X-ray microscopy. The new optics utilized a micro-electro-mechanical-system (MEMS)-based template to accommodate two …
View article: Machine-learning-based automatic small-angle measurement between planar surfaces in interferometer images: A 2D multilayer Laue lenses case
Machine-learning-based automatic small-angle measurement between planar surfaces in interferometer images: A 2D multilayer Laue lenses case Open
View article: A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II
A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II Open
The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick–Bae…
View article: Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy
Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy Open
Nano-piezoelectric materials have drawn tremendous research interest. However, characterization of their piezoelectric properties, especially measuring the piezoelectric strain coefficients, remains a challenge. Normally, researchers use a…
View article: Cavity and Cryomodule Developements for EIC
Cavity and Cryomodule Developements for EIC Open
The EIC is a major new project under construction at BNL in partnership with JLab. It relies upon a number of new SRF cavities at 197 MHz, 394 MHz, 591 MHz and 1773 MHz to pre-bunch, accelerate, cool and crab the stored beams. R is focusin…
View article: Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II
Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II Open
X-ray microscopy is an invaluable and powerful characterization tool applied in many scientific fields, such as materials science, biology, environmental science, and energy research. In recent years it has been driven by rapid development…
View article: Metrology of a Focusing Capillary Using Optical Ptychography
Metrology of a Focusing Capillary Using Optical Ptychography Open
The focusing property of an ellipsoidal monocapillary has been characterized using the ptychography method with a 405 nm laser beam. The recovered wavefront gives a 12.5×10.4μm2 focus. The reconstructed phase profile of the focused beam ca…
View article: Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy
Micromachined Silicon Platform for Precise Assembly of 2D Multilayer Laue Lenses for High-Resolution X-ray Microscopy Open
We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 × 10 mm2 and is fabricated on ~500 µm thick silicon wafers throug…
View article: 2D MEMS-based multilayer Laue lens nanofocusing optics for high-resolution hard x-ray microscopy
2D MEMS-based multilayer Laue lens nanofocusing optics for high-resolution hard x-ray microscopy Open
We report on the development of 2D integrated multilayer Laue lens (MLL) nanofocusing optics used for high-resolution x-ray microscopy. A Micro-Electro-Mechanical-Systems (MEMS) - based template has been designed and fabricated to accommod…
View article: X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3
X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3 Open
Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along w…
View article: X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions
X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions Open
X-ray microscopy is a mature characterization tool routinely used to answer various questions of science, technology and engineering. The high penetration power of X-rays allows to utilize different characterization methods and reveal elem…
View article: Focusing of hard x-rays with monolithic two-dimensional multilayer Laue lenses: technical challenges and current status
Focusing of hard x-rays with monolithic two-dimensional multilayer Laue lenses: technical challenges and current status Open
Hard X-ray microscopy is a powerful scientific tool capable of providing sub-10 nm spatial resolution imaging of material’s chemical composition and internal structure. Multilayer Laue Lenses (MLLs) have been developed and used for hard x-…
View article: Stitching interferometry for synchrotron mirror metrology at National Synchrotron Light Source II (NSLS-II)
Stitching interferometry for synchrotron mirror metrology at National Synchrotron Light Source II (NSLS-II) Open
View article: Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline
Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline Open
A transmission X-ray microscope has been designed and commissioned at the 18-ID Full-field X-ray Imaging beamline at the National Synchrotron Light Source II. This instrument operates in the 5–11 keV range, and, with the current set of opt…
View article: One-minute nano-tomography using hard X-ray full-field transmission microscope
One-minute nano-tomography using hard X-ray full-field transmission microscope Open
Full field transmission X-ray microscopy (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility…
View article: Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science
Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science Open
We report multimodal scanning hard x-ray imaging with spatial resolution approaching 10 nm and its application to contemporary studies in the field of material science. The high spatial resolution is achieved by focusing hard x-rays with t…
View article: Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II Open
A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissi…
View article: High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope
High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope Open
Multilayer Laue lenses (MLLs) are x-ray focusing optics with the potential to focus hard x-rays down to a single nanometer level. In order to achieve point focus, an MLL microscope needs to have the capability to perform tip-tilt motion of…
View article: Holistic Interactions of Shallow Clouds, Aerosols, and Land-Ecosystems (HI-SCALE): National Geospatial-Intelligence Agency Calibration Target Placements Field Campaign Report
Holistic Interactions of Shallow Clouds, Aerosols, and Land-Ecosystems (HI-SCALE): National Geospatial-Intelligence Agency Calibration Target Placements Field Campaign Report Open
The purpose of our research has been to develop a capability of simulating image collection from any sensor so as to account for sensor configuration, ground spectral radiance, and atmospheric contributions. Atmosphere is arguably the most…
View article: Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges
Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges Open
The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamli…
View article: Development and characterization of monolithic multilayer Laue lens nanofocusing optics
Development and characterization of monolithic multilayer Laue lens nanofocusing optics Open
We have developed an experimental approach to bond two independent linear Multilayer Laue Lenses (MLLs) together. A monolithic MLL structure was characterized using ptychography at 12 keV photon energy, and we demonstrated 12 nm and 24 nm …
View article: Nm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challenges
Nm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challenges Open
The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamli…
View article: Performance and characterization of a MEMS-based device for alignment and manipulation of x-ray nanofocusing optics
Performance and characterization of a MEMS-based device for alignment and manipulation of x-ray nanofocusing optics Open
X-ray microscopy is a powerful, non-invasive tool used for nanometer-scale resolution imaging, and it is widely applied in various areas of science and technology. To push the spatial resolution of x-ray microscopy studies in the hard x-ra…
View article: Pushing the limits: an instrument for hard X-ray imaging below 20 nm
Pushing the limits: an instrument for hard X-ray imaging below 20 nm Open
Hard X-ray microscopy is a prominent tool suitable for nanoscale-resolution non-destructive imaging of various materials used in different areas of science and technology. With an ongoing effort to push the 2D/3D imaging resolution down to…