Shi-Jie Wen
YOU?
Author Swipe
View article: Multi-Dimensional Reliability Assessment of Distribution Network Under Renewable Energy Installation and Load Installation
Multi-Dimensional Reliability Assessment of Distribution Network Under Renewable Energy Installation and Load Installation Open
This paper proposes a novel multi-dimensional reliability evaluation method for distribution network under renewable energy installation and load installation, considering fault reconfiguration and multiple constraints. Firstly, the relate…
View article: Viscoelasticity-enhanced stability and ice-breaking performance of submerged water jet at long standoff distances
Viscoelasticity-enhanced stability and ice-breaking performance of submerged water jet at long standoff distances Open
View article: Study on Human Factor Reliability under the Dynamic Evolution of Intelligent Lifting Construction Accidents
Study on Human Factor Reliability under the Dynamic Evolution of Intelligent Lifting Construction Accidents Open
This research explores human factors involved in intelligent lifting construction operations risks to prevent errors and manage processes affecting risk evolution. The study employs the human factors analysis and classification system with…
View article: Current Status and Application of Laminar Flow Control Airfoil Design Technology
Current Status and Application of Laminar Flow Control Airfoil Design Technology Open
Laminar flow control (LFC) airfoil design technology is a critical technology in modern aviation, it can significantly reduce drag and enhance fuel efficiency, which is increasingly crucial due to rising fuel prices and stringent environme…
View article: SEU Cross-Section Trends for Threshold Voltage Options From 16- to 3-nm Bulk FinFET Nodes
SEU Cross-Section Trends for Threshold Voltage Options From 16- to 3-nm Bulk FinFET Nodes Open
View article: Excess noise and thermoelectric effect in magnetron-sputtered VO2 thin films
Excess noise and thermoelectric effect in magnetron-sputtered VO2 thin films Open
This work presents the excess noise and thermoelectric (Seebeck) measurements on polycrystalline vanadium dioxide (VO2) thin films. Noise spectral power density (SPD) of current fluctuations in the semiconducting (SC) phase had a typical f…
View article: Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes
Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes Open
With modern integrated circuits (ICs) operating at the GHz range of operation, the single-event (SE) cross-section of an average logic circuit feeding data into a conventional latch has become comparable to the latch SE cross-section. Logi…
View article: Letting Go of Self-Domain Awareness: Multi-Source Domain-Adversarial Generalization via Dynamic Domain-Weighted Contrastive Transfer Learning
Letting Go of Self-Domain Awareness: Multi-Source Domain-Adversarial Generalization via Dynamic Domain-Weighted Contrastive Transfer Learning Open
Domain generalization (DG), which aims to learn a model that can generalize to an unseen target domain, has recently attracted increasing research interest. A major approach is to learn domain invariant representations to avoid greedily ca…
View article: Design and Research of Channel Circuit Based on Broadband Power Line Carrier
Design and Research of Channel Circuit Based on Broadband Power Line Carrier Open
In order to effectively improve the anti-attenuation, anti-noise and anti-impedance change capabilities of the low-voltage narrowband power line carrier communication unit, reduce the carrier signal coupling attenuation, and highly fidelit…
View article: Nanodisperse transition metal electrodes (NTME) for electrochemical cells
Nanodisperse transition metal electrodes (NTME) for electrochemical cells Open
Disclosed are transition metal electrodes for electrochemical cells using gel-state and solid-state polymers. The electrodes are suitable for use in primary and secondary cells. The electrodes (either negative electrode or positive electro…
View article: Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform
Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform Open
High-bandwidth memory 2 (HBM2) vertically stacks multiple dynamic random-access memory (DRAM) dies to achieve a small form factor and high capacity. However, it is difficult to diagnose HBM2 issues owing to their structural complexity and …
View article: Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of DC Magnetron Sputtered VO2 Thin Films
Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of DC Magnetron Sputtered VO2 Thin Films Open
This study focuses on the effect of the substrate temperature (TS) on the quality of VO2 thin films prepared by DC magnetron sputtering. TS was varied from 350 to 600 °C and the effects on the surface morphology, microstructure, optical an…
View article: KiCi
KiCi Open
Wearable-based human activity recognition (HAR) is commonly employed in real-world scenarios such as health monitoring, auxiliary diagnosis, etc. As implementing activity recognition is a daunting challenge in an open dynamic environment, …
View article: Generative Anomaly Detection for Time Series Datasets
Generative Anomaly Detection for Time Series Datasets Open
Traffic congestion anomaly detection is of paramount importance in intelligent traffic systems. The goals of transportation agencies are two-fold: to monitor the general traffic conditions in the area of interest and to locate road segment…
View article: Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation Open
The methodological approach of hammering multiple rows is newly proposed to evaluate today’s SDRAMs, employed with in-DRAM mitigation circuits. The multiple rows are selected based on the one-row hammering test (single row hammering withou…
View article: Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160
Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160 Open
The authors would like to correct a typographical error in their paper [...]
View article: An Aircraft Laboratory Climatic Test Quality Control Model Based on Airworthiness Review
An Aircraft Laboratory Climatic Test Quality Control Model Based on Airworthiness Review Open
The establishment and continuous optimization of the quality control process and program of aircraft laboratory climatic test can form a quality review system that meets the requirement of the administrator and the needs of the users. Base…
View article: Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research
Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research Open
Research on single event effects (SEEs) is significant to the design and manufacture of modern electronic devices. By applying two photon absorption (TPA) ultra-fast pulsed lasers, extra electron-hole pairs (EHPs) are generated in a desire…
View article: The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior
The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior Open
In this work, VO2 thin films were deposited on Si wafers (onto (100) surface) by DC magnetron sputtering under different cathode bias voltages. The effects of substrate biasing on the structural and optical properties were investigated. Th…
View article: Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device Open
View article: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation Open
The contribution of alpha particles to soft error rate is quite significant, especially in planar CMOS technology. Due to high packaging density and heat dissipation mitigation technique, microelectronic devices are packaged upside down, w…
View article: Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627] Open
View article: Terrestrial Muon Flux Measurement at Low Energies for Soft Error Studies
Terrestrial Muon Flux Measurement at Low Energies for Soft Error Studies Open
A large volume scintillator detector has been used to measure the terrestrial stopping muon rate under different conditions of location, altitude, shielding and weather to determine the range of variation of the low energy muon flux. About…
View article: The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate
The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate Open
Low- and high-energy proton experimental data and error rate predictions are presented for many bulk Si and SOI circuits from the 20-90 nm technology nodes to quantify how much low-energy protons (LEPs) can contribute to the total on-orbit…
View article: New insights into the impact of SEUs in FPGA CRAMs
New insights into the impact of SEUs in FPGA CRAMs Open
This paper presents a detailed study of the impact of SEUs in the configuration RAM (CRAM) of SRAM based FPGAs. Since modern SRAM based FPGAs support scrubbing of the CRAM, a new, intermittent CRAM SEU fault model is presented. This fault …