Zhangpeng Wei
YOU?
Author Swipe
View article: Semantic mask-based two-step approach: a general framework for X-ray diffraction peak search in high-throughput molecular sieve synthetic system
Semantic mask-based two-step approach: a general framework for X-ray diffraction peak search in high-throughput molecular sieve synthetic system Open
X-ray diffraction (XRD) is used for characterizing the crystal structure of molecular sieves after synthetic experiments. However, for a high-throughput molecular sieve synthetic system, the huge amount of data derived from large throughpu…
View article: Erratum to “Merged-Sampling Mask R-CNN With Random Proposal Expansion for Particle Measurement of SEM Images of Molecular Sieve Catalysts”
Erratum to “Merged-Sampling Mask R-CNN With Random Proposal Expansion for Particle Measurement of SEM Images of Molecular Sieve Catalysts” Open
In the above article [1] , row 3 paragraph 3 in Section III-B, the width equals to as it is shown in Fig. 4.