Zhikun Chang
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View article: Nanometric Displacement Measurement Based on Self-Mixing Interferometry Using Sinusoidally Current-Modulated Laser and Cr Atom Lithography Grating
Nanometric Displacement Measurement Based on Self-Mixing Interferometry Using Sinusoidally Current-Modulated Laser and Cr Atom Lithography Grating Open
View article: Nanometer displacement measurement based on metrological self-mixing grating interferometer traceable to the pitch standard of one-dimension chromium self-traceable grating
Nanometer displacement measurement based on metrological self-mixing grating interferometer traceable to the pitch standard of one-dimension chromium self-traceable grating Open
Traceability of precision instrument and measuring method is the core issue in metrology science. In the field of nanometer length measurement, the laser interferometers are usually used to trace the measurement value to the laser waveleng…