Total external reflection
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What is the Temporal Analog of Reflection and Refraction of Optical Beams? Open
It is shown numerically and analytically that when an optical pulse approaches a moving temporal boundary across which the refractive index changes, it undergoes a temporal equivalent of reflection and refraction of optical beams at a spat…
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Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses Open
In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett. 91, 204801 (2003)], the concept of adiabatically focusing refr…
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Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films Open
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-o…
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Nanofocusing Optics for an X-Ray Free-Electron Laser Generating an Extreme Intensity of 100 EW/cm2 Using Total Reflection Mirrors Open
A nanofocusing optical system—referred to as 100 exa—for an X-ray free-electron laser (XFEL) was developed to generate an extremely high intensity of 100 EW/cm2 (1020 W/cm2) using total reflection mirrors. The system is based on Kirkpatric…
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Extraordinary reflection and refraction from natural hyperbolic materials Open
The reflection and refraction were theoretically investigated for a linearly-polarized wave incident upon the surface of a naturally hyperbolic material. We proposed that this material is uniaxial and possesses two hyperbolic-frequency ban…
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Retrieval of the complex-valued refractive index of germanium near the M<sub>4,5</sub> absorption edge Open
The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by multi-angle reflectance of synchrotron radiation. The resulting index of refraction is higher resolution than previously measured values. I…
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Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy Open
Capabilities of the attenuated total reflection (ATR) at THz wavelengths for increased sub-surface depth characterisation of (bio-)materials are presented. The penetration depth of a THz evanescent wave in biological samples is dependent o…
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Negative Refraction in Weyl Semimetals Open
We theoretically propose that Weyl semimetals may exhibit negative refraction at some frequencies close to the plasmon frequency, allowing transverse magnetic (TM) electromagnetic waves with frequencies smaller than the plasmon frequency t…
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Portable Total Reflection X-ray Fluorescence Spectrometer with a Detection Limit in the 100 ng/L Range Open
In this study, a method was presented for detecting low concentrations of elements in a high purity water sample using a portable total reflection X-ray fluorescence (TXRF) spectrometer. Preparing the dry residue of a sample droplet with l…
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Effect of reflection and refraction on NEXAFS spectra measured in TEY mode Open
The evolution of near-edge X-ray absorption fine structure in the vicinity of the K -absorption edge of oxygen for HfO 2 over a wide range of incidence angles is analyzed by simultaneous implementation of the total-electron-yield (TEY) met…
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Uniform refraction in negative refractive index materials Open
We study the problem of constructing an optical surface separating two homogeneous, isotropic media, one of which has a negative refractive index. In doing so, we develop a vector form of Snell's law, which is used to study surfaces posses…
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Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources Open
A prototype of a highly adjustable Kirkpatrick-Baez (KB) microscope has been designed, built, and tested in a number of laser driven x-ray experiments using the high power (200 TW) VEGA-2 laser system of the Spanish Centre for Pulsed Laser…
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A refraction correction for buried interfaces applied to <i>in situ</i> grazing-incidence X-ray diffraction studies on Pd electrodes Open
In situ characterization of electrochemical systems can provide deep insights into the structure of electrodes under applied potential. Grazing-incidence X-ray diffraction (GIXRD) is a particularly valuable tool owing to its ability to cha…
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Determination of refractive index of various materials on Brewster angle Open
Studied experimentally the origin of the non-zero reflection of p-polarized radiation (TM) of Brewster's angle. The results have shown the residual reflected light in the vicinity of Brewster angle occurs due to inaccessibility 100% polari…
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Low-cost reflective Hilger–Chance refractometer used to determine Sellmeier coefficients of bulk polydimethylsiloxane Open
Refractometry is important for characterizing the optical performance of materials. The refractive index can quickly be assessed using critical angle or thin-film techniques. However, these methods only assess the material surface. Measure…
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Reflection and Refraction Formulas Open
Surfaces reflect. Glass, water, and similar materials both reflect and refract. The reflection and refraction formulas are at the heart of ray tracing. These are not easy to find in the literature in the vector forms needed for generating …
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Broadband radiation pressure on a small period diffractive film Open
The p-polarization component of radiation pressure force from an unpolarized blackbody light source is predicted by the use of a Maxwell equation solver for a right triangular prism grating of period 2 μm and refractive index 3.5. The tran…
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Determination of refractive index on three mediums based on the principle of refraction of light Open
This study aims to develop a tool to determine the refractive index and height of objects in three media based on the principle of light refraction. The method used was an experimental method. The results showed the refractive index values…
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A Novel Method for Measurement of the Refractive Indices of Transparent Solid Media Using Laser Interferometry Open
The refractive index is a number that governs how light changes its direction of propagation as it enters one material medium from another. This phenomenon is known as refraction and the angles of incidence and refraction of light, referre…
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Development of sound reflection and refraction experiment equipment Open
The reflection and refraction of light are more familiar to students than the reflection and refraction of sound. Reflection and refraction that occur during the transmission of sound waves are common phenomena in everyday life but are oft…
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The Ellipsometrical Analysis of External Reflection of Light on Superficial Films on Solid Substrates Open
The ellipsometrical analysis of the external specular reflection of light on nonabsorbing superficial films allows us to know factors which influence the ellipsometric measurement of the analyzed system. For optical nonabsorbing superficia…
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Ellipsometry of thin films of biological objects under conditions of total internal reflection Open
An analysis of the ellipsometric parameters of the reflected light from the prism test material air system is carried out when circularly polarized light is incident on it under the conditions of the onset of the phenomenon of total intern…
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Nanofocusing optics for an X-ray free-electron laser generating an extreme intensity of 100 EW/cm$^2$ using total reflection mirrors Open
A nanofocusing optical system referred to as $\textit{100 exa}$ for an X-ray free-electron laser (XFEL) was developed to generate an extremely high intensity of 100 EW/cm$^2$ (10$^2$$^0$ W/cm$^2$) using total reflection mirrors. The system…
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Determining the complex refractive index from two discrete angles in the specular reflectance profile of p polarized light Open
Upon illumination with p polarized light, the reflectance profile at an interface between a front transparent and a rear attenuating medium contains two characteristic angles that can be measured with sufficient accuracy by use of common l…
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Analytical study of optical dielectric interfaces for sensing applications Open
Dynamic optical sensors, as those based on the reflectivity of isotropic dielectrical interfaces, can be useful for measuring small changes in the refractive index of fluid media. Exact and approximated explicit formulas for their sensitiv…
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Determination of Complex Refractive Index using Maximum Deviation Angle through Prism Open
Light-absorbing materials are widely used, and their optical properties are an important factor. Snell's law does not hold in materials that partially absorb light. Hence, the optical path in refraction is calculated from Maxwell's law. We…
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Determination of Complex Refractive Index using Prism composed of Absorbing Medium Open
In light refraction between two transparent media, Snell's law describes the relationship between the incident angle and refraction angle. The refractive index is usually determined from Snell's law using the minimum deviation angle throug…
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The Speed of Light Is Slowed Down as It Travels Near the Surface of an Obstacle Open
The speed of propagation of light that passes through a medium at a slower speed determines the refractive index with respect to the wavelength. Subsequently, the refractive index of vacuum (free space) that light travels at speed c is 1 b…
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Reflection and Refraction of the Laser Light Pulse at the Vacuum-Medium Interface Open
By generalizing the well known results for reflection and refraction of plane waves at the vacuum-medium interface to Gaussian light beams, we obtain analytic formulas for reflection and refraction of the TM and TE laser light pulses. This…
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Analytical Method for Reflection and Refraction Open
In computer graphics, ray tracing is very simple and powerful method to present physical phenomena especially light-related things such as reflection and refraction since it traces the ray from the eye to the light source; however, we cann…