Dimensional metrology ≈ Dimensional metrology
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On the metrology of interparticle contacts in sand from x-ray tomography images Open
International audience
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Optical metrology for digital manufacturing: a review Open
With the increasing adoption of Industry 4.0, optical metrology has experienced a significant boom in its implementation, as an ever-increasing number of manufacturing processes are overhauled for in-process measurement and control. As suc…
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Industry 4.0 implications in machine vision metrology: an overview Open
Industry 4.0 is changing disruptively all the industrial processes from their base, and metrology is being challenged by this new 'wave' of rethinking industry. Therefore, new quality control systems are being conceived for measurement pur…
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Towards in-process x-ray CT for dimensional metrology Open
X-ray computed tomography (CT) offers significant potential as a metrological tool, given the wealth of internal and external data that can be captured, much of which is inaccessible to conventional optical and tactile coordinate measureme…
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State of the Art of Tactile Micro Coordinate Metrology Open
Micro parts are increasingly found in a number of industrial products. They often have complex geometrical features in the millimeter to micrometer range which are not accessible or difficult to measure by conventional coordinate measuring…
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Moving towards in-line metrology: evaluation of a Laser Radar system for in-line dimensional inspection for automotive assembly systems Open
The increasing interest towards intelligent systems has led to a demand for the development of zero-defect strategies, with a paradigm shift from off-line and dedicated to in-line metrology with integrated robotic systems. However, a major…
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Some Considerations about the Use of Contact and Confocal Microscopy Methods in Surface Texture Measurement Open
Surface metrology employs various measurement techniques, among which there has been an increase of noteworthy research into non-contact optical and contact stylus methods. However, some deeper considerations about their differentiation an…
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Picometer-Stable Hexagonal Optical Bench to Verify LISA Phase Extraction Linearity and Precision Open
The Laser Interferometer Space Antenna (LISA) and its metrology chain have to fulfill stringent performance requirements to enable the space-based detection of gravitational waves. This implies the necessity of performance verification met…
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Reference object for evaluating the accuracy of porosity measurements by X-ray computed tomography Open
Internal defects such as voids and porosity directly influence mechanical properties, durability, service life and other characteristics of industrial parts. There are several non-destructive and destructive methods for defects detection a…
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Integrated metrology for advanced manufacturing Open
The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts …
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Application of Monte Carlo simulation for estimation of uncertainty of four-point roundness measurements of rolls Open
Large-scale rotors in the paper and steel industry are called rolls. Rolls are reground at regular intervals and roundness measurements are made throughout the machining process. Measurement systems for roundness and diameter variation of …
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Development of surface reconstruction algorithms for optical interferometric measurement Open
Optical interferometry is a powerful tool for measuring and characterizing areal surface topography in precision manufacturing. A variety of instruments based on optical interferometry have been developed to meet the measurement needs in v…
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X-ray computed tomography for metal additive manufacturing: challenges and solutions for accuracy enhancement Open
Additively manufactured parts are characterized by metrological challenges and complexities, due to several reasons, including the inherent presence of internal defects and complex surface topography. Micro X-ray computed tomography is cur…
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Residual flatness and scale calibration for a point autofocus surface topography measuring instrument Open
Point autofocus instruments are often used for measuring the surface topography of objects with complex geometry. Determining the metrological characteristics of the instrument is key to ensuring a traceable areal surface topography measur…
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Digital twins for metrology; metrology for digital twins Open
Digital twinning is a rapidly growing area of research. Digital twins combine models and data to provide up-to-date information about the state of a system. They support reliable decision-making in fields such as structural monitoring and …
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Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology Open
At this time, there is no instrument capable of measuring a nano-object along the three spatial dimensions with a controlled uncertainty. The combination of several instruments is thus necessary to metrologically characterize the dimension…
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ISO test survey on material influence in dimensional computed tomography Open
ISO/TC 213/WG 10 is responsible for creating international standards (series ISO 10360) for the acceptance testing of coordinate measuring systems (CMSs). A current topic is creating a future part of ISO 10360 for CMSs using dimensional co…
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Overview of 3D Micro- and Nanocoordinate Metrology at PTB Open
Improved metrological capabilities for three-dimensional (3D) measurements of various complex micro- and nanoparts are increasingly in demand. This paper gives an overview of the research activities carried out by the Physikalisch-Technisc…
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Methods and considerations to determine sphere center from terrestrial laser scanner point cloud data Open
The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) is performing research to support the development of documentary standards within ASTM E57 committee. This committee is addressing the point…
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Charting the course towards dimensional measurement traceability by x-ray computed tomography Open
Long synonymous with medical imaging, x-ray computed tomography (CT) is proving its worth in industrial applications such as material characterization, defect analysis, and dimensional inspection e.g. of manufactured components. Since 2005…
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3D Metrology Using a Collaborative Robot with a Laser Triangulation Sensor Open
Industrial robots are a key element in Smart Manufacturing systems. They can perform many different tasks such as assembly, pick-and-place, or even 3D metrology operations. In order to perform 3D metrology, the robot is equipped with a 2D …
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Surface-Sensing Principle of Microprobe System for Micro-Scale Coordinate Metrology: A Review Open
Micro-coordinate measuring machines (micro-CMMs) for measuring microcomponents require a probe system with a probe tip diameter of several tens to several hundreds of micrometers. Scale effects work for such a small probe tip, i.e., the pr…
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A Micro-Coordinate Measurement Machine (CMM) for Large-Scale Dimensional Measurement of Micro-Slits Open
This paper presents a micro-coordinate measuring machine (micro-CMM) for large-scale dimensional measurement of a micro-slit on a precision die coater by using a shear-mode micro-probe. A glass micro sphere with a nominal diameter of 52.3 …
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Assessment of the Measurement Procedure for Dimensional Metrology with X-ray Computed Tomography Open
X-ray computed tomography (CT) is a promising technology for quality assurance of industrial parts. However, computed tomography for dimensional metrology is a complex and indirect measurement procedure, whose results depend on a variety o…
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Six Degree of Freedom Vibration Isolation Platform for In-Line Nano-Metrology Open
A six degree of freedom, magnetically levitated metrology platform is proposed and implemented to enable nano-scale measurements directly in a production environment by providing vibration isolation. The metrology platform maintains a cons…
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Three-Dimensional Network Adjustment of Laser Tracker Measurements for Large-Scale Metrology Applications Open
The adjustment of laser tracker network measurements for large-scale metrology applications has unique considerations not commonly encountered in the network adjustment approaches generally used in either standard metrology or in tradition…
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Environmental influences on autocollimator-based angle and form metrology Open
Deflectometric profilometers are indispensable tools for the precision form measurement of beam-shaping optics of synchrotrons and x-ray free electron lasers. They are used in metrology labs for x-ray optics worldwide and are crucial for p…
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Surface Metrology Principles for Snow and Ice Friction Studies Open
Recent advances in surface metrology science are applied to understanding friction with snow and ice. Conventional surface metrology’s measurement, analyses, and characterizations, have inherent limitations for elucidating tribological int…
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Optical diffraction tomography meets metrology — Measurement accuracy on cellular and subcellular level Open
Three-dimensional quantitative phase imaging (3D QPI) delivers volumetric information about the refractive index distribution within microobjects. Such imaging and measurement capabilities are of great interest for technical and biomedical…
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Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devices Open
As semiconductor devices shrink and their manufacturing processes advance, accurately measuring in-cell critical dimensions (CD) becomes increasingly crucial. Traditional test element group (TEG) measurements are becoming inadequate for re…